2 Test Method

The devices under test (DUTs) were put through a 240-hour burn-in with the units biased and operational at 125°C ambient prior to the radiation testing.

Irradiation and electrical testing were done at Texas Instruments Radiation Test Facility in Santa Clara, California.

The DUTs were placed in socketed bias boards (as shown in Figure 2-1), powered up, irradiated and electrically tested at 0, 30, 50, and 100krad (Si). All specified data sheet and SMD parameters were tested. In addition to the specified parameters, the test program tests many other parameters to verify the proper operation of the device. Limits are set using a six sigma baseline.

Figure 2-1 LMX1906-SP TID Bias Board