CD4504B-EP

ACTIVO

Sensor de nivel de tensión hexadecimal CMOS para funcionamiento TTL a CMOS o CMOS a CMOS

Detalles del producto

Technology family CD4000 Bits (#) 6 Configuration 6 Ch A to B 0 Ch B to A High input voltage (min) (V) 2 High input voltage (max) (V) 18 Vout (min) (V) 15538 Vout (max) (V) 18 Data rate (max) (Mbps) 24 IOH (max) (mA) -6.8 IOL (max) (mA) -6.8 Supply current (max) (µA) 18 Features 22 Input type Standard CMOS Output type Balanced CMOS, Push-Pull Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family CD4000 Bits (#) 6 Configuration 6 Ch A to B 0 Ch B to A High input voltage (min) (V) 2 High input voltage (max) (V) 18 Vout (min) (V) 15538 Vout (max) (V) 18 Data rate (max) (Mbps) 24 IOH (max) (mA) -6.8 IOL (max) (mA) -6.8 Supply current (max) (µA) 18 Features 22 Input type Standard CMOS Output type Balanced CMOS, Push-Pull Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
TSSOP (PW) 16 32 mm² 5 x 6.4
  • Independence of Power-Supply Sequence Considerations – VCC Can Exceed VDD;
    Input Signals Can Exceed Both VCC and VDD
  • Up and Down Level-Shifting Capability
  • Shiftable Input Threshold for Either CMOS or TTL Compatibility
  • Standardized Symmetrical Output Characteristics
  • 100% Tested for Quiescent Current at 20 V
  • Maximum Input Current of 1 µA at 18 V Over Full Package-Temperature Range:
    100 nA at 18 V and 25°C
  • 5 V, 10 V, and 15 V Parametric Ratings
  • Meets All Requirements of JEDEC Standard No. 13B,
    "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • SUPPORTS DEFENSE, AEROSPACE, AND MEDICAL APPLICATIONS
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Military (–55°C/125°C) Temperature Range(1)
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability

(1) Additional temperature ranges are available – contact factory

  • Independence of Power-Supply Sequence Considerations – VCC Can Exceed VDD;
    Input Signals Can Exceed Both VCC and VDD
  • Up and Down Level-Shifting Capability
  • Shiftable Input Threshold for Either CMOS or TTL Compatibility
  • Standardized Symmetrical Output Characteristics
  • 100% Tested for Quiescent Current at 20 V
  • Maximum Input Current of 1 µA at 18 V Over Full Package-Temperature Range:
    100 nA at 18 V and 25°C
  • 5 V, 10 V, and 15 V Parametric Ratings
  • Meets All Requirements of JEDEC Standard No. 13B,
    "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • SUPPORTS DEFENSE, AEROSPACE, AND MEDICAL APPLICATIONS
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Military (–55°C/125°C) Temperature Range(1)
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability

(1) Additional temperature ranges are available – contact factory

CD4504B hex voltage level-shifter consists of six circuits which shift input signals from the VCC logic level to the VDD logic level. To shift TTL signals to CMOS logic levels, the SELECT input is at the VCC HIGH logic state. When the SELECT input is at a LOW logic state, each circuit translates signals from one CMOS level to another.

CD4504B hex voltage level-shifter consists of six circuits which shift input signals from the VCC logic level to the VDD logic level. To shift TTL signals to CMOS logic levels, the SELECT input is at the VCC HIGH logic state. When the SELECT input is at a LOW logic state, each circuit translates signals from one CMOS level to another.

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Documentación técnica

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Tipo Título Fecha
* Data sheet CMOS Hex Voltage-Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation datasheet 03 sep 2008
* VID CD4504B-EP VID V6209606 21 jun 2016
* Radiation & reliability report CD4504BMPWREP Reliability Report 12 sep 2012
Selection guide Voltage Translation Buying Guide (Rev. A) 15 abr 2021
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
User guide Signal Switch Data Book (Rev. A) 14 nov 2003
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 03 dic 2001

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Paquete Pasadores Descargar
TSSOP (PW) 16 Ver opciones

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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