CY74FCT543T

ACTIVO

Transceptores octal registrados con salidas de 3 estados

Detalles del producto

Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Number of channels 8 IOL (max) (mA) 64 IOH (max) (mA) -32 Input type TTL Output type TTL Features Partial power down (Ioff), Very high speed (tpd 5-10ns) Technology family FCT Rating Catalog Operating temperature range (°C) -40 to 85
Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Number of channels 8 IOL (max) (mA) 64 IOH (max) (mA) -32 Input type TTL Output type TTL Features Partial power down (Ioff), Very high speed (tpd 5-10ns) Technology family FCT Rating Catalog Operating temperature range (°C) -40 to 85
SOIC (DW) 24 159.65 mm² 15.5 x 10.3 SSOP (DBQ) 24 51.9 mm² 8.65 x 6
  • Function, Pinout, and Drive Compatible With FCT and F Logic
  • Reduced VOH (Typically = 3.3 V) Versions of Equivalent FCT Functions
  • Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics
  • Ioff Supports Partial-Power-Down Mode Operation
  • Matched Rise and Fall Times
  • Fully Compatible With TTL Input and Output Logic Levels
  • 3-State Outputs
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)
  • Separation Controls for Data Flow in Each Direction
  • Back-to-Back Latches for Storage
  • CY54FCT543T
    • 48-mA Output Sink Current
    • 12-mA Output Source Current
  • CY74FCT543T
    • 64-mA Output Sink Current
    • 32-mA Output Source Current

  • Function, Pinout, and Drive Compatible With FCT and F Logic
  • Reduced VOH (Typically = 3.3 V) Versions of Equivalent FCT Functions
  • Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics
  • Ioff Supports Partial-Power-Down Mode Operation
  • Matched Rise and Fall Times
  • Fully Compatible With TTL Input and Output Logic Levels
  • 3-State Outputs
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)
  • Separation Controls for Data Flow in Each Direction
  • Back-to-Back Latches for Storage
  • CY54FCT543T
    • 48-mA Output Sink Current
    • 12-mA Output Source Current
  • CY74FCT543T
    • 64-mA Output Sink Current
    • 32-mA Output Source Current

The \x92FCT543T octal latched transceivers contain two sets of eight D-type latches with separate latch-enable (LEAB\, LEBA\) and output-enable (OEAB\, OEBA\) inputs for each set to permit independent control of input and output in either direction of data flow. For data flow from A to B, for example, the A-to-B enable (CEAB\) input must be low in order to enter data from A or to take data from B, as indicated in the function table. With CEAB\ low, a low signal on the A-to-B latch-enable (LEAB\) input makes the A-to-B latches transparent; a subsequent low-to-high transition of the LEAB\ signal puts the A latches in the storage mode and their outputs no longer change with the A inputs. With CEAB\ and OEAB\ low, the 3-state B-output buffers are active and reflect the data present at the output of the A latches. Control of data from B to A is similar, but uses CEBA\, LEBA\, and OEBA\ inputs.

These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

The \x92FCT543T octal latched transceivers contain two sets of eight D-type latches with separate latch-enable (LEAB\, LEBA\) and output-enable (OEAB\, OEBA\) inputs for each set to permit independent control of input and output in either direction of data flow. For data flow from A to B, for example, the A-to-B enable (CEAB\) input must be low in order to enter data from A or to take data from B, as indicated in the function table. With CEAB\ low, a low signal on the A-to-B latch-enable (LEAB\) input makes the A-to-B latches transparent; a subsequent low-to-high transition of the LEAB\ signal puts the A latches in the storage mode and their outputs no longer change with the A inputs. With CEAB\ and OEAB\ low, the 3-state B-output buffers are active and reflect the data present at the output of the A latches. Control of data from B to A is similar, but uses CEBA\, LEBA\, and OEBA\ inputs.

These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

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Documentación técnica

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Tipo Título Fecha
* Data sheet 8-Bit Latched Registered Transceivers With 3-State Outputs datasheet (Rev. A) 01 oct 2001
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
Application note Selecting the Right Level Translation Solution (Rev. A) 22 jun 2004
User guide CYFCT Parameter Measurement Information 02 abr 2001
Selection guide Advanced Bus Interface Logic Selection Guide 09 ene 2001

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

14-24-LOGIC-EVM — Módulo de evaluación genérico de productos lógicos para encapsulados D, DB, DGV, DW, DYY, NS y PW de

El módulo de evaluación 14-24-LOGIC-EVM (EVM) está diseñado para admitir cualquier dispositivo lógico que esté en un encapsulado D, DW, DB, NS, PW, DYY o DGV de 14 a 24 pines.

Guía del usuario: PDF | HTML
Paquete Pasadores Descargar
SOIC (DW) 24 Ver opciones
SSOP (DBQ) 24 Ver opciones

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

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