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LF398-N

ACTIVO

Circuito de retención y muestra monolítico (adquisición de 10 µs, desplazamiento de 7 mV)

Detalles del producto

Rating Catalog Operating temperature range (°C) 0 to 70
Rating Catalog Operating temperature range (°C) 0 to 70
PDIP (P) 8 92.5083 mm² 9.81 x 9.43 SOIC (D) 14 51.9 mm² 8.65 x 6
  • Operates from ±5-V to ±18-V Supplies
  • Less than 10-µs Acquisition Time
  • Logic Input Compatible With TTL, PMOS, CMOS
  • 0.5-mV Typical Hold Step at Ch = 0.01 µF
  • Low Input Offset
  • 0.002% Gain Accuracy
  • Low Output Noise in Hold Mode
  • Input Characteristics Do Not Change During Hold Mode
  • High Supply Rejection Ratio in Sample or Hold
  • Wide Bandwidth
  • Space Qualified, JM38510
  • Operates from ±5-V to ±18-V Supplies
  • Less than 10-µs Acquisition Time
  • Logic Input Compatible With TTL, PMOS, CMOS
  • 0.5-mV Typical Hold Step at Ch = 0.01 µF
  • Low Input Offset
  • 0.002% Gain Accuracy
  • Low Output Noise in Hold Mode
  • Input Characteristics Do Not Change During Hold Mode
  • High Supply Rejection Ratio in Sample or Hold
  • Wide Bandwidth
  • Space Qualified, JM38510

The LFx98x devices are monolithic sample-and-hold circuits that use BI-FET technology to obtain ultrahigh DC accuracy with fast acquisition of signal and low droop rate. Operating as a unity-gain follower, DC gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin and does not degrade input offset drift. The wide bandwidth allows the LFx98x to be included inside the feedback loop of 1-MHz operational amplifiers without having stability problems. Input impedance of 1010 Ω allows high-source impedances to be used without degrading accuracy.

P-channel junction FETs are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1-µF hold capacitor. The JFETs have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design ensures no feedthrough from input to output in the hold mode, even for input signals equal to the supply voltages.

Logic inputs on the LFx98x are fully differential with low input current, allowing for direct connection to TTL, PMOS, and CMOS. Differential threshold is
1.4 V. The LFx98x will operate from ±5-V to ±18-V supplies.

An A version is available with tightened electrical specifications.

The LFx98x devices are monolithic sample-and-hold circuits that use BI-FET technology to obtain ultrahigh DC accuracy with fast acquisition of signal and low droop rate. Operating as a unity-gain follower, DC gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin and does not degrade input offset drift. The wide bandwidth allows the LFx98x to be included inside the feedback loop of 1-MHz operational amplifiers without having stability problems. Input impedance of 1010 Ω allows high-source impedances to be used without degrading accuracy.

P-channel junction FETs are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1-µF hold capacitor. The JFETs have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design ensures no feedthrough from input to output in the hold mode, even for input signals equal to the supply voltages.

Logic inputs on the LFx98x are fully differential with low input current, allowing for direct connection to TTL, PMOS, and CMOS. Differential threshold is
1.4 V. The LFx98x will operate from ±5-V to ±18-V supplies.

An A version is available with tightened electrical specifications.

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Documentación técnica

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* Data sheet LFx98x Monolithic Sample-and-Hold Circuits datasheet (Rev. C) PDF | HTML 05 oct 2018
Application note AN-298 Isolation Techniques for Signal Conditioning (Rev. B) 06 may 2013
Application note AN-301 Signal Conditioning for Sophisticated Transducers (Rev. B) 06 may 2013
Application note Applications of the LM3524 Pulse Width Modulator (Rev. B) 23 abr 2013
Application note Using ADC0808/809 8-Bit uP Compble ADCs w/8-Chan Analog Multiplexr (Rev. B) 22 abr 2013
More literature Die D/S LF398 MDC Monolithic Sample And Hold Circuit 07 sep 2012
Application note Data Acq Using ADC0816 & ADC0817 8-Bit ADC w/On-Chip 16 Chan Multiplexr 10 may 2004
Application note AN-294 Special Sample and Hold Techniques 10 may 2004
Application note Specifications and Architectures of Sample-and-Hold Amplifiers 03 may 2004
Application note Freq-to-Vltg Converter Uses Sample-and-Hold to Improve Response & Ripple 03 oct 2002

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Herramienta de simulación

TINA-TI — Programa de simulación analógica basado en SPICE

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
Guía del usuario: PDF
Paquete Pasadores Descargar
PDIP (P) 8 Ver opciones
SOIC (D) 14 Ver opciones

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

El contenido lo proporcionan “tal como está” TI y los colaboradores de la comunidad y no constituye especificaciones de TI. Consulte los términos de uso.

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