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SN65LVDS33-EP

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Detalles del producto

Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Supply voltage (V) 3.3 Signaling rate (MBits) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Supply voltage (V) 3.3 Signaling rate (MBits) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 16 59.4 mm² 9.9 x 6
  • Controlled Baseline — One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up to -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • 400-Mbps Signaling Rate(2) and 200-Mxfr/s Data Transfer Rate
  • Operates With a Single 3.3-V Supply
  • -4-V to 5-V Common-Mode Input Voltage Range
  • Differential Input Thresholds < ±50 mV With 50 mV of Hysteresis Over Entire Common-Mode Input Voltage Range
  • Integrated 110- Line Termination Resistors On LVDT Products
  • Complies With TIA/EIA-644 (LVDS)
  • Active Failsafe Assures a High-Level Output With No Input
  • Bus-Pin ESD Protection Exceeds 15-kV HBM
  • Input Remains High-Impedance On Power Down
  • TTL Inputs Are 5-V Tolerant
  • Pin-Compatible With the AM26LS32, SN65LVDS32B, µA9637, SN65LVDS9637B

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
(2) The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).

  • Controlled Baseline — One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up to -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • 400-Mbps Signaling Rate(2) and 200-Mxfr/s Data Transfer Rate
  • Operates With a Single 3.3-V Supply
  • -4-V to 5-V Common-Mode Input Voltage Range
  • Differential Input Thresholds < ±50 mV With 50 mV of Hysteresis Over Entire Common-Mode Input Voltage Range
  • Integrated 110- Line Termination Resistors On LVDT Products
  • Complies With TIA/EIA-644 (LVDS)
  • Active Failsafe Assures a High-Level Output With No Input
  • Bus-Pin ESD Protection Exceeds 15-kV HBM
  • Input Remains High-Impedance On Power Down
  • TTL Inputs Are 5-V Tolerant
  • Pin-Compatible With the AM26LS32, SN65LVDS32B, µA9637, SN65LVDS9637B

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
(2) The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).

This family of four LVDS data line receivers offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5-V PECL signal as well as an overall increased ground-noise tolerance. They are in industry standard footprints with integrated termination as an option.

Precise control of the differential input voltage thresholds allows for inclusion of 50 mV of input voltage hysteresis to improve noise rejection on slowly changing input signals. The input thresholds are still no more than +50 mV over the full input common-mode voltage range.

The high-speed switching of LVDS signals usually necessitates the use of a line impedance matching resistor at the receiving-end of the cable or transmission media. The SN65LVDT series of receivers eliminates this external resistor by integrating it with the receiver. The nonterminated SN65LVDS series is also available for multidrop or other termination circuits.

The receivers can withstand ±15-kV human-body model (HBM) and ±600-V machine model (MM) electrostatic discharges to the receiver input pins with respect to ground without damage. This provides reliability in cabled and other connections where potentially damaging noise is always a threat.

The receivers also include a (patent pending) failsafe circuit that provides a high-level output within 600 ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions. This feature may also be used for Wired-Or bus signaling. See The Active Failsafe Feature of the SN65LVDS32B application note.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100 . The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN65LVDS33-EP is characterized for operation from -55°C to 125°C.

This family of four LVDS data line receivers offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5-V PECL signal as well as an overall increased ground-noise tolerance. They are in industry standard footprints with integrated termination as an option.

Precise control of the differential input voltage thresholds allows for inclusion of 50 mV of input voltage hysteresis to improve noise rejection on slowly changing input signals. The input thresholds are still no more than +50 mV over the full input common-mode voltage range.

The high-speed switching of LVDS signals usually necessitates the use of a line impedance matching resistor at the receiving-end of the cable or transmission media. The SN65LVDT series of receivers eliminates this external resistor by integrating it with the receiver. The nonterminated SN65LVDS series is also available for multidrop or other termination circuits.

The receivers can withstand ±15-kV human-body model (HBM) and ±600-V machine model (MM) electrostatic discharges to the receiver input pins with respect to ground without damage. This provides reliability in cabled and other connections where potentially damaging noise is always a threat.

The receivers also include a (patent pending) failsafe circuit that provides a high-level output within 600 ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions. This feature may also be used for Wired-Or bus signaling. See The Active Failsafe Feature of the SN65LVDS32B application note.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100 . The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN65LVDS33-EP is characterized for operation from -55°C to 125°C.

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Documentación técnica

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Tipo Título Fecha
* Data sheet SN65LVDS33-EP High-Speed Differential Receivers datasheet (Rev. B) 19 abr 2007
* VID SN65LVDS33-EP VID V6205614 21 jun 2016
* Radiation & reliability report SN65LVDS33MDREP Reliability Report 06 sep 2013
Application brief LVDS to Improve EMC in Motor Drives 27 sep 2018
Application brief How Far, How Fast Can You Operate LVDS Drivers and Receivers? 03 ago 2018
Application brief How to Terminate LVDS Connections with DC and AC Coupling 16 may 2018

Diseño y desarrollo

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Placa de evaluación

SN65LVDS31-33EVM — Módulo de evaluación para SN65LVDS31 y SN65LVDS33

TI offers a series of low-voltage differential signaling (LVDS) evaluation modules (EVMs) designed for analysis of the electrical characteristics of LVDS drivers and receivers. Four unique EVMs are available to evaluate the different classes of LVDS devices offered by TI.

As seen in the Combination (...)

Guía del usuario: PDF
Modelo de simulación

SN65LVDS33 IBIS Model (Rev. A)

SLLC069A.ZIP (6 KB) - IBIS Model
Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Herramienta de simulación

TINA-TI — Programa de simulación analógica basado en SPICE

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
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SOIC (D) 16 Ver opciones

Pedidos y calidad

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  • Marcado del dispositivo
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  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
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  • Lugar de fabricación
  • Lugar de ensamblaje

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