CY54FCT138T
- Function, Pinout, and Drive Compatible With FCT and F Logic
- Reduced VOH (Typically = 3.3 V) Versions of Equivalent FCT Functions
- Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics
- Ioff Supports Partial-Power-Down Mode Operation
- Matched Rise and Fall Times
- Fully Compatible With TTL Input and Output Logic Levels
- Dual 1-of-8 Decoder With Enables
- ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)
- CY54FCT138T
- 32-mA Output Sink Current
- 12-mA Output Source Current
- CY74FCT138T
- 64-mA Output Sink Current
- 32-mA Output Source Current
The \x92FCT138T devices are 1-of-8 decoders. These devices accept three binary weighted inputs (A0, A1, A2) and, when enabled, provide eight mutually exclusive active-low outputs (O\0\x96O\7). The \x92FCT138T devices feature three enable inputs: two active low (E\1, E\2) and one active high (E3 ).
All outputs are high unless E\1 and E\2 are low and E3 is high. This multiple-enable function allows easy parallel expansion of the device to a 1-of-32 (five lines to 32 lines) decoder with just four \x92FCT138T devices and one inverter.
These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
기술 문서
| 유형 | 직함 | 날짜 | ||
|---|---|---|---|---|
| * | Data sheet | 1-of-8 Decoders datasheet (Rev. B) | 2001/10/15 | |
| * | SMD | CY54FCT138T SMD 5962-92233 | 2016/06/21 | |
| Selection guide | Logic Guide (Rev. AB) | 2017/06/12 | ||
| Application note | Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) | 2015/12/02 | ||
| User guide | LOGIC Pocket Data Book (Rev. B) | 2007/01/16 | ||
| Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004/07/08 | ||
| Application note | Selecting the Right Level Translation Solution (Rev. A) | 2004/06/22 | ||
| User guide | CYFCT Parameter Measurement Information | 2001/04/02 | ||
| Selection guide | Advanced Bus Interface Logic Selection Guide | 2001/01/09 |
설계 및 개발
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주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치