SN54AC02-DIE

Name: SN54AC02-DIE
Brand: TI
SKU: SN54AC02-DIE
Price: 208.1 USD

활성

쿼드러플 2입력 양극-NOR 게이트

지금 주문

데이터시트

document-pdfAcrobat Rad-Tolerant Space Grade Die, Quadruple 2-Input Positive-NOR Gates datasheet (영어)

SN54AC02-DIE

활성

데이터시트

지금 주문

제품 상세 정보

Product type

Logic

Die or wafer type

Tested Die

Rating

Space

Operating temperature range (°C)

25 to 25

Product type

Logic

Die or wafer type

Tested Die

Rating

Space

Operating temperature range (°C)

25 to 25

DIESALE (TD)

—

See data sheet

AC Types Feature 1.5-V to 5.5-V Operation
Rad-Tolerant: 50 KRad(Si) TID⁽¹⁾
- TID Dose Rate < 2 mRad/sec

⁽¹⁾ Radiation tolerance is a typical value based upon initial device qualification. Radiation Lot Acceptance Testing is available - contact factory for details.

AC Types Feature 1.5-V to 5.5-V Operation
Rad-Tolerant: 50 KRad(Si) TID⁽¹⁾
- TID Dose Rate < 2 mRad/sec

⁽¹⁾ Radiation tolerance is a typical value based upon initial device qualification. Radiation Lot Acceptance Testing is available - contact factory for details.

The SN54AC02-DIE device contains four independent 2-input NOR gates that perform the Boolean function Y = A • B or Y = A + B in positive logic.

open-in-new

기타 다이 및 웨이퍼 서비스 찾기

다운로드 스크립트와 함께 비디오 보기 동영상

관심 가지실만한 유사 제품

open-in-new

대안 비교

다른 핀 출력을 지원하지만 비교 대상 장치와 동일한 기능

신규 SN74LV4T02-EP

활성

향상된 제품, 통합 레벨 시프터가 있는 4채널 2입력 NOR 게이트 Voltage range (1.65V to 5.5V), voltage translation capable

기술 문서

star

=TI에서 선정한 이 제품의 인기 문서

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모두 보기14

	유형	직함	날짜
*	Data sheet	Rad-Tolerant Space Grade Die, Quadruple 2-Input Positive-NOR Gates datasheet	2013/05/22
	Selection guide	TI Space Products (Rev. I)	2022/03/03
	Application note	Implications of Slow or Floating CMOS Inputs (Rev. E)	2021/07/26
	Selection guide	Logic Guide (Rev. AB)	2017/06/12
	Application note	Understanding and Interpreting Standard-Logic Data Sheets (Rev. C)	2015/12/02
	More literature	HiRel Unitrode Power Management Brochure	2009/07/07
	User guide	LOGIC Pocket Data Book (Rev. B)	2007/01/16
	Application note	Semiconductor Packing Material Electrostatic Discharge (ESD) Protection	2004/07/08
	Application note	TI IBIS File Creation, Validation, and Distribution Processes	2002/08/29
	Application note	CMOS Power Consumption and CPD Calculation (Rev. B)	1997/06/01
	Application note	Designing With Logic (Rev. C)	1997/06/01
	Application note	Input and Output Characteristics of Digital Integrated Circuits	1996/10/01
	Application note	Live Insertion	1996/10/01
	Application note	Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc	1996/04/01