SN74LS47
- '46A, '47A, 'LS47 feature
- Open-Collector Outputs Drive Indicators Directly
- Lamp-Test Provision
- Leading/Trailing Zero Suppression
- '48, 'LS48 feature
- Internal Pull-Ups Eliminate Need for External Resistors
- Lamp-Test Provision
- Leading/Trailing Zero Suppression
- 'LS49 feature
- Open-Collector Outputs
- Blanking Input
- All Circuit Types Feature Lamp Intensity Modulation Capability
The '46A, '47A, and 'LS47 feature active-low outputs designed for driving, common-anode LEDs or incandescent indicators directly. The '48, 'LS48, and 'LS49 feature active-high outputs for driving lamp buffers or common-cathode LEDs. All of the circuits except 'LS49 have full ripple-blanking input/output controls and a lamp test input. The 'LS49 circuit incorporates a direct blanking input. Segment identification and resultant displays are shown below. Display patterns for BCD input counts above 9 are unique symbols to authenticate input conditions.
The '46A, '47A, '48, 'LS47, and 'LS48 circuits incorporate automatic leading and/or trailing-edge zero-blanking control (RBI\ and RBO\). Lamp test (LT\) of these types may be performed at any time when the BI\/RBO\ node is at a high level. All types (including the '49 and 'LS49) contain an overriding blanking input (BI\), which can be used to control the lamp intensity by pulsing or to inhibit the outputs. Inputs and outputs are entirely compatible for use with TTL logic outputs.
The SN54246/SN74246 and '247 and the SN54LS247/SN74LS247 and 'LS248 compose the 6 and the 9 with tails and were designed to offer the designer a choice between two indicator fonts.
관심 가지실만한 유사 제품
비교 대상 장치와 동일한 기능을 지원하는 핀 대 핀
기술 문서
| 유형 | 직함 | 날짜 | ||
|---|---|---|---|---|
| * | Data sheet | BCD-to-Seven-Segment Decoders/Drivers datasheet | 1988/03/01 | |
| Selection guide | Logic Guide (Rev. AB) | 2017/06/12 | ||
| Application note | Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) | 2015/12/02 | ||
| User guide | LOGIC Pocket Data Book (Rev. B) | 2007/01/16 | ||
| Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004/07/08 | ||
| Application note | TI IBIS File Creation, Validation, and Distribution Processes | 2002/08/29 | ||
| Application note | Designing With Logic (Rev. C) | 1997/06/01 | ||
| Application note | Designing with the SN54/74LS123 (Rev. A) | 1997/03/01 | ||
| Application note | Input and Output Characteristics of Digital Integrated Circuits | 1996/10/01 | ||
| Application note | Live Insertion | 1996/10/01 |
설계 및 개발
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주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치