SBAS945B February 2022 – December 2024 AMC23C14
PRODUCTION DATA
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| ANALOG INPUT | ||||||
| RIN | Input resistance | IN pin, 0 ≤ VIN ≤ 4 V | 1 | GΩ | ||
| IBIAS | Input bias current | IN pin, 0 ≤ VIN ≤ 4 V(4) | 0.1 | 25 | nA | |
| IN pin, –400 mV ≤ VIN ≤ 0 V(5) | –310 | –0.5 | ||||
| CIN | Input capacitance | IN pin | 4 | pF | ||
| REFERENCE PIN | ||||||
| IREF | Reference current | REF to GND1, 20 mV < VREF ≤ 2.7 V | 99 | 100 | 101 | μA |
| VMSEL | Mode selection threshold(2) | VREF rising | 500 | 550 | 600 | mV |
| VREF falling | 450 | 500 | 550 | |||
| Mode selection threshold hysteresis | 50 | mV | ||||
| 300-mV FIXED-THRESHOLD COMPARATORS (CMP2 AND CMP3) | ||||||
| VIT+ | Positive-going trip threshold | Cmp2 | 304 | mV | ||
| EIT+ | Positive-going trip threshold error | Cmp2 | –3.5 | 3.5 | mV | |
| VIT– | Negative-going trip threshold | Cmp2 | 300 | mV | ||
| EIT– | Negative-going trip threshold error | Cmp2 | –3.5 | 3.5 | mV | |
| VIT– | Negative-going trip threshold | Cmp3 | –304 | mV | ||
| EIT– | Negative-going trip threshold error | Cmp3 | –4.5 | 4.5 | mV | |
| VIT+ | Positive-going trip threshold | Cmp3 | –300 | mV | ||
| EIT+ | Positive-going trip threshold error | Cmp3 | –4.5 | 4.5 | mV | |
| VHYS | Trip threshold hysteresis | Cmp2 and Cmp3, (VIT+ – VIT–) | 4 | mV | ||
| VARIABLE-THRESHOLD COMPARATORS (CMP0 AND CMP1) | ||||||
| VIT+ | Positive-going trip threshold | Cmp0 | VREF + VHYS | mV | ||
| EIT+ | Positive-going trip threshold error | Cmp0, (VIT+ – VREF – VHYS), VREF = 20 mV, VHYS = 4 mV |
–2 | 2 | mV | |
| Cmp0, (VIT+ – VREF – VHYS), VREF = 250 mV, VHYS = 4 mV |
–2 | 2 | ||||
| Cmp0, (VIT+ – VREF – VHYS), VREF = 2 V, VHYS = 25 mV |
–5 | 5 | ||||
| VIT– | Negative-going trip threshold | Cmp0 | VREF | mV | ||
| EIT– | Negative-going trip threshold error | Cmp0, (VIT– – VREF), VREF = 20 mV | –2.5 | 2.5 | mV |
|
| Cmp0, (VIT– – VREF), VREF = 250 mV | –2.5 | 2.5 | ||||
| Cmp0, (VIT– – VREF), VREF = 2 V | –5 | 5 | ||||
| VIT– | Negative-going trip threshold | Cmp1 | –VREF – VHYS | mV | ||
| EIT– | Negative-going trip threshold error | Cmp1, (VIT– + VREF + VHYS), VREF = 20 mV, VHYS = 4 mV |
–3 | 3 | mV |
|
| Cmp1, (VIT– + VREF + VHYS), VREF = 250 mV, VHYS = 4 mV |
–3 | 3 | ||||
| VIT+ | Positive-going trip threshold | Cmp1 | –VREF | mV | ||
| EIT+ | Positive-going trip threshold error | Cmp1, (VIT+ + VREF), VREF = 20 mV | –3.5 | 3.5 | mV | |
| Cmp1, (VIT+ + VREF), VREF = 250 mV | –3.5 | 3.5 | ||||
| VHYS | Trip threshold hysteresis | Cmp0 and Cmp1, (VIT+ – VIT–), VREF ≤ 450 mV | 4 | mV | ||
| Cmp0 only, (VIT+ – VIT–), VREF ≥ 600 mV | 25 | |||||
| DIGITAL OUTPUTS | ||||||
| VOL | Low-level output voltage | ISINK = 4 mA | 80 | 250 | mV | |
| ILKG | Open-drain output leakage current | VDD2 = 5 V, VOUT = 5 V | 5 | 100 | nA | |
| CMTI | Common-mode transient immunity | |VIN – VREF| ≥ 4 mV, RPULLUP = 10 kΩ | 15 | 40 | V/ns | |
| POWER SUPPLY | ||||||
| VDD1UV | VDD1 undervoltage detection threshold | VDD1 rising | 3 | V | ||
| VDD1 falling | 2.9 | |||||
| VDD1POR | VDD1 power-on reset threshold | VDD1 falling | 2.3 | V | ||
| VDD2UV | VDD2 undervoltage detection threshold | VDD2 rising | 2.7 | V | ||
| VDD2 falling | 2.1 | |||||
| IDD1 | High-side supply current | 3.0 V ≤ VDD1 ≤ 3.4 V | 4.0 | mA | ||
| 3.4 V < VDD1 ≤ 27 V | 3.2 | 4.3 | ||||
| IDD2 | Low-side supply current | 1.8 | 2.2 | mA | ||