SLUSE96 November   2023 BQ76907

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison Table
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information bq76907
    5. 6.5  Supply Current
    6. 6.6  Digital I/O
    7. 6.7  REGOUT LDO
    8. 6.8  Voltage References
    9. 6.9  Coulomb Counter
    10. 6.10 Coulomb Counter Digital Filter
    11. 6.11 Current Wake Detector
    12. 6.12 Analog-to-Digital Converter
    13. 6.13 Cell Balancing
    14. 6.14 Internal Temperature Sensor
    15. 6.15 Thermistor Measurement
    16. 6.16 Hardware Overtemperature Detector
    17. 6.17 Internal Oscillator
    18. 6.18 Charge and Discharge FET Drivers
    19. 6.19 Comparator-Based Protection Subsystem
    20. 6.20 Timing Requirements - I2C Interface, 100kHz Mode
    21. 6.21 Timing Requirements - I2C Interface, 400kHz Mode
    22. 6.22 Timing Diagram
    23. 6.23 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Configuration
      1. 7.3.1 Commands and Subcommands
      2. 7.3.2 Configuration Using OTP or Registers
      3. 7.3.3 Device Security
    4. 7.4 Device Hardware Features
      1. 7.4.1  Voltage ADC
      2. 7.4.2  Coulomb Counter and Digital Filters
      3. 7.4.3  Protection FET Drivers
      4. 7.4.4  Voltage References
      5. 7.4.5  Multiplexer
      6. 7.4.6  LDOs
      7. 7.4.7  Standalone Versus Host Interface
      8. 7.4.8  ALERT Pin Operation
      9. 7.4.9  Low Frequency Oscillator
      10. 7.4.10 I2C Serial Communications Interface
    5. 7.5 Measurement Subsystem
      1. 7.5.1 Voltage Measurement
        1. 7.5.1.1 Voltage ADC Scheduling
        2. 7.5.1.2 Unused VC Pins
        3. 7.5.1.3 General Purpose ADCIN Functionality
      2. 7.5.2 Current Measurement and Charge Integration
      3. 7.5.3 Internal Temperature Measurement
      4. 7.5.4 Thermistor Temperature Measurement
      5. 7.5.5 Factory Trim and Calibration
    6. 7.6 Protection Subsystem
      1. 7.6.1 Protections Overview
      2. 7.6.2 Primary Protections
      3. 7.6.3 CHG Detector
      4. 7.6.4 Cell Open-Wire Protection
      5. 7.6.5 Diagnostic Checks
    7. 7.7 Cell Balancing
    8. 7.8 Device Operational Modes
      1. 7.8.1 Overview of Operational Modes
      2. 7.8.2 NORMAL Mode
      3. 7.8.3 SLEEP Mode
      4. 7.8.4 DEEPSLEEP Mode
      5. 7.8.5 SHUTDOWN Mode
      6. 7.8.6 CONFIG_UPDATE Mode
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Performance Plot
      4. 8.2.4 Random Cell Connection Support
      5. 8.2.5 Startup Timing
      6. 8.2.6 FET Driver Turn-Off
      7. 8.2.7 Usage of Unused Pins
  10. Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Support Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  13. 12Revision History
  14. 13Introduction to Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Current Measurement and Charge Integration

The BQ76907 device monitors pack current using a low-side sense resistor that connects to the SRP and SRN pins through an external RC filter, which should be connected such that a charging current will create a positive voltage on SRP relative to SRN. The differential voltage between SRP and SRN is digitized by an integrated coulomb counter ADC, which can digitize voltages over a ±200 mV range and uses multiple digital filters to provide optimized measurement of the instantaneous and integrated current. The device supports a wide range of sense resistor values, with a larger value providing better resolution for the digitized result. The maximum value of sense resistor should be limited to ensure the differential voltage remains within the ±200-mV range for system operation when current measurement is desired. For example, a system with maximum discharge current of 200 A during normal operation (not a fault condition) should limit the sense resistor to 1 mΩ or below.

The SRP and SRN pins can also support higher positive voltages relative to VSS, such as may occur during overcurrent or short circuit in discharge conditions, without damage to the device, although the current is not accurately digitized in this case. For example, a system with a 1-mΩ sense resistor and the Short Circuit in Discharge protection threshold programmed to a 500 mV level would trigger an SCD protection fault when a discharge current of 500 A was detected.

The coulomb counter integrates two hardware digital filters (CC1 and CC2), which each provide a separate digital output. The CC2 digital filter generates a 24-bit raw output and has programmable timing and resolution output, with the output rate also affecting the resolution of the conversion. The effective resolution (defined as the resolution such that the data exhibits 1-sigma variation with ±1-LSB) of the coulomb counter conversions increases with longer timing between output data. The setting options when the coulomb counter is in full power mode are 366 μs (which results in 13-bit effective resolution), 732 μs (14-bit effective resolution), 1.46 ms (15-bit effective resolution), or 2.93 ms (16-bit effective resolution). This output rate is set using data memory configuration bits. In addition, the coulomb counter supports a low power mode, which operates at a 16 times slower rate than the settings listed above, with similar resolution performance at each setting, but drawing only 4 μA rather than ~60 μA at full power.

The CC1 filter generates a 16-bit current measurement that is used for charge integration and other decision purposes, with one output generated every 250 ms when the device is operating in NORMAL mode and the coulomb counter in full power mode, or one output every 4 seconds when the device is operating in low power mode.

The integrated passed charge (from integration of the CC1 processed result) is available as a 48-bit value, which includes the upper 16 bits of accumulated charge as the integer portion, the lower 32 bits of accumulated charge as the fractional portion, and a 32-bit accumulated time over which the charge has been integrated in units of seconds. The accumulated charge integration and timer can be reset by a command from the host over the digital communications interface. Note that the charge and time are not integrated while in SLEEP mode.

See the BQ76907 Technical Reference Manual for more details on current measurement, charge integration, and their associated programmable settings.