SWRS111G June 2011 – January 2026 CC1121
PRODUCTION DATA
TA = 25°C, VDD = 3.0 V if nothing else stated
| PARAMETER | MIN | TYP | MAX | UNIT | CONDITION |
|---|---|---|---|---|---|
| Crystal frequency | 31.25 | 32 | 33.6 | MHz | It is expected that there will be degraded sensitivity at multiples of XOSC/2 in RX, and an increase in spurious emissions when the RF channel is close to multiples of XOSC in TX. We recommend that the RF channel is kept RX_BW/2 away from XOSC/2 in RX, and that the level of spurious emissions be evaluated if the RF channel is closer than 1 MHz to multiples of XOSC in TX. |
| Load capacitance (CL) | 10 | pF | |||
| ESR | 60 | Ω | Simulated over operating conditions | ||
| Start-up time | 0.4 | ms | Depends on crystal |