SLPS481B December 2013 – October 2014 CSD19506KCS
PRODUCTION DATA.
Refer to the PDF data sheet for device specific package drawings
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-Source Voltage | VGS = 0 V, ID = 250 μA | 80 | V | |||
IDSS | Drain-to-Source Leakage Current | VGS = 0 V, VDS = 64 V | 1 | μA | |||
IGSS | Gate-to-Source Leakage Current | VDS = 0 V, VGS = 20 V | 100 | nA | |||
VGS(th) | Gate-to-Source Threshold Voltage | VDS = VGS, ID = 250 μA | 2.1 | 2.5 | 3.2 | V | |
RDS(on) | Drain-to-Source On-Resistance | VGS = 6 V, ID = 100 A | 2.2 | 2.8 | mΩ | ||
VGS = 10 V, ID = 100 A | 2.0 | 2.3 | mΩ | ||||
gfs | Transconductance | VDS = 8 V, ID = 100 A | 297 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input Capacitance | VGS = 0 V, VDS = 40 V, ƒ = 1 MHz | 9380 | 12200 | pF | ||
Coss | Output Capacitance | 2260 | 2940 | pF | |||
Crss | Reverse Transfer Capacitance | 42 | 55 | pF | |||
RG | Series Gate Resistance | 1.3 | 2.6 | Ω | |||
Qg | Gate Charge Total (10 V) | VDS = 40 V, ID = 100 A | 120 | 156 | nC | ||
Qgd | Gate Charge Gate to Drain | 20 | nC | ||||
Qgs | Gate Charge Gate to Source | 37 | nC | ||||
Qg(th) | Gate Charge at Vth | 25 | nC | ||||
Qoss | Output Charge | VDS = 40 V, VGS = 0 V | 345 | nC | |||
td(on) | Turn On Delay Time | VDS = 40 V, VGS = 10 V, IDS = 100 A, RG = 0 Ω |
19 | ns | |||
tr | Rise Time | 11 | ns | ||||
td(off) | Turn Off Delay Time | 30 | ns | ||||
tf | Fall Time | 10 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode Forward Voltage | ISD = 100 A, VGS = 0 V | 0.9 | 1.1 | V | ||
Qrr | Reverse Recovery Charge | VDS= 40 V, IF = 100 A, di/dt = 300 A/μs |
525 | nC | |||
trr | Reverse Recovery Time | 107 | ns |
THERMAL METRIC | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|
RθJC | Junction-to-Case Thermal Resistance | 0.4 | °C/W | ||
RθJA | Junction-to-Ambient Thermal Resistance | 62 |