SLAS950A May 2013 – June 2015 DAC7562-Q1 , DAC7563-Q1 , DAC8162-Q1 , DAC8163-Q1 , DAC8562-Q1 , DAC8563-Q1
PRODUCTION DATA.
| MIN | MAX | UNIT | ||
|---|---|---|---|---|
| AVDD to GND | –0.3 | 6 | V | |
| CLR, DIN, LDAC, SCLK and SYNC input voltage to GND | –0.3 | AVDD + 0.3 | V | |
| VOUT[A, B] to GND | –0.3 | AVDD + 0.3 | V | |
| VREFIN/VREFOUT to GND | –0.3 | AVDD + 0.3 | V | |
| Operating temperature | –40 | 125 | °C | |
| Junction temperature, TJ max | 150 | °C | ||
| Storage temperature, Tstg | –65 | 150 | °C | |
| VALUE | UNIT | ||||
|---|---|---|---|---|---|
| V(ESD) | Electrostatic discharge | Human-body model (HBM), per AEC Q100-002(1) | ±2000 | V | |
| Charged-device model (CDM), per AEC Q100-011 | All pins | ±500 | |||
| Corner pins (1, 5, 6, and 10) | ±750 | ||||
| MIN | NOM | MAX | UNIT | |||
|---|---|---|---|---|---|---|
| POWER SUPPLY | ||||||
| Supply voltage | AVDD to GND | 2.7 | 5.5 | V | ||
| DIGITAL INPUTS | ||||||
| Digital input voltage | CLR, DIN, LDAC, SCLK and SYNC | 0 | AVDD | V | ||
| REFERENCE INPUT | ||||||
| VREFIN | Reference input voltage | 0 | AVDD | V | ||
| TEMPERATURE RANGE | ||||||
| TA | Operating ambient temperature | –40 | 125 | °C | ||
| THERMAL METRIC(1) | DACxx6x-Q1 | UNIT | |
|---|---|---|---|
| DGS (VSSOP) | |||
| 10 PINS | |||
| RθJA | Junction-to-ambient thermal resistance | 173.8 | °C/W |
| RθJC(top) | Junction-to-case (top) thermal resistance | 48.5 | °C/W |
| RθJB | Junction-to-board thermal resistance | 79.9 | °C/W |
| ψJT | Junction-to-top characterization parameter | 1.7 | °C/W |
| ψJB | Junction-to-board characterization parameter | 68.4 | °C/W |
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
|---|---|---|---|---|---|---|---|
| STATIC PERFORMANCE(1) | |||||||
| DAC856x-Q1 | Resolution | 16 | Bits | ||||
| Relative accuracy | Using line passing through codes 512 and 65,024 | ±4 | ±12 | LSB | |||
| Differential nonlinearity | 16-bit monotonic | ±0.2 | ±1 | LSB | |||
| DAC816x-Q1 | Resolution | 14 | Bits | ||||
| Relative accuracy | Using line passing through codes 128 and 16,256 | ±1 | ±3 | LSB | |||
| Differential nonlinearity | 14-bit monotonic | ±0.1 | ±0.5 | LSB | |||
| DAC756x-Q1 | Resolution | 12 | Bits | ||||
| Relative accuracy | Using line passing through codes 32 and 4,064 | ±0.3 | ±0.75 | LSB | |||
| Differential nonlinearity | 12-bit monotonic | ±0.05 | ±0.25 | LSB | |||
| Offset error | Extrapolated from two-point line(1), unloaded | ±1 | ±4 | mV | |||
| Offset error drift | ±2 | µV/°C | |||||
| Full-scale error | DAC register loaded with all 1s | ±0.03 | ±0.2 | % FSR | |||
| Zero-code error | DAC register loaded with all 0s | 1 | 4 | mV | |||
| Zero-code error drift | ±2 | µV/°C | |||||
| Gain error | Extrapolated from two-point line(1), unloaded | ±0.01 | ±0.15 | % FSR | |||
| Gain temperature coefficient | ±1 | ppm FSR/°C | |||||
| OUTPUT CHARACTERISTICS(2) | |||||||
| Output voltage range | 0 | AVDD | V | ||||
| Output voltage settling time(3) | DACs unloaded | 7 | µs | ||||
| RL = 1 MΩ | 10 | ||||||
| Slew rate | Measured between 20% - 80% of a full-scale transition | 0.75 | V/µs | ||||
| Capacitive load stability | RL = ∞ | 1 | nF | ||||
| RL = 2 kΩ | 3 | ||||||
| Code-change glitch impulse | 1-LSB change around major carry | 0.1 | nV-s | ||||
| Digital feedthrough | SCLK toggling, SYNC high | 0.1 | nV-s | ||||
| Power-on glitch impulse | RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V | 40 | mV | ||||
| Code-change total glitch amplitude | 1-LSB change around major carry. Includes glitch impulse and digital feedthrough. RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V |
3 | mV | ||||
| Channel-to-channel DC crosstalk | Full-scale swing on adjacent channel, External reference |
5 | µV | ||||
| Full-scale swing on adjacent channel, Internal reference |
15 | ||||||
| DC output impedance | At mid-scale input | 5 | Ω | ||||
| Short-circuit current | DAC outputs at full-scale, DAC outputs shorted to GND | 40 | mA | ||||
| Power-up time, including settling time | Coming out of power-down mode | 50 | µs | ||||
| AC PERFORMANCE(2) | |||||||
| DAC output noise density | TA = 25°C, at mid-scale input, fOUT = 1 kHz | 90 | nV/√Hz | ||||
| DAC output noise | TA = 25°C, at mid-scale input, 0.1 Hz to 10 Hz | 2.6 | µVPP | ||||
| LOGIC INPUTS(2) | |||||||
| Input pin Leakage current | –1 | ±0.1 | 1 | µA | |||
| Logic input LOW voltage VINL | 0 | 0.8 | V | ||||
| Logic input HIGH voltage VINH | 0.7 × AVDD | AVDD | V | ||||
| Pin capacitance | 3 | pF | |||||
| REFERENCE | |||||||
| External reference current | External VREF = 2.5 V (when internal reference is disabled), all channels active using gain = 1 | 15 | µA | ||||
| Reference input impedance | Internal reference disabled, gain = 1 | 170 | kΩ | ||||
| Internal reference disabled, gain = 2 | 85 | ||||||
| REFERENCE OUTPUT | |||||||
| Output voltage | TA = 25°C | 2.495 | 2.5 | 2.505 | V | ||
| Initial accuracy | TA = 25°C | –5 | ±0.1 | 5 | mV | ||
| Output voltage temperature drift | 4 | 10 | ppm/°C | ||||
| Output voltage noise | f = 0.1 Hz to 10 Hz | 12 | µVPP | ||||
| Output voltage noise density (high-frequency noise) | TA = 25°C, f = 1 kHz, CL = 0 µF | 250 | nV/√Hz | ||||
| TA = 25°C, f = 1 MHz, CL = 0 µF | 30 | ||||||
| TA = 25°C, f = 1 MHz, CL = 4.7 µF | 10 | ||||||
| Load regulation, sourcing(4) | TA = 25°C | 20 | µV/mA | ||||
| Load regulation, sinking(4) | TA = 25°C | 185 | µV/mA | ||||
| Output current load capability(2) | ±20 | mA | |||||
| Line regulation | TA = 25°C | 50 | µV/V | ||||
| Long-term stability and drift (aging)(4) | TA = 25°C, time = 0 to 1900 hours | 100 | ppm | ||||
| Thermal hysteresis(4) | First cycle | 200 | ppm | ||||
| Additional cycles | 50 | ||||||
| POWER REQUIREMENTS(5) | |||||||
| IDD | AVDD = 3.6 V to 5.5 V | Normal mode, internal reference off | 0.25 | 0.5 | mA | ||
| Normal mode, internal reference on | 0.9 | 1.6 | |||||
| Power-down modes(6) | 0.55 | 2 | µA | ||||
| Power-down modes(7) | 0.55 | 4 | |||||
| AVDD = 2.7 V to 3.6 V | Normal mode, internal reference off | 0.2 | 0.4 | mA | |||
| Normal mode, internal reference on | 0.73 | 1.4 | |||||
| Power-down modes(6) | 0.35 | 2 | µA | ||||
| Power-down modes(7) | 0.35 | 3 | |||||
| Power dissipation | AVDD = 3.6 V to 5.5 V | Normal mode, internal reference off | 0.9 | 2.75 | mW | ||
| Normal mode, internal reference on | 3.2 | 8.8 | |||||
| Power-down modes(6) | 2 | 11 | µW | ||||
| Power-down modes(7) | 2 | 22 | |||||
| AVDD = 2.7 V to 3.6 V | Normal mode, internal reference off | 0.54 | 1.44 | mW | |||
| Normal mode, internal reference on | 1.97 | 5 | |||||
| Power-down modes(6) | 0.95 | 7.2 | µW | ||||
| Power-down modes(7) | 0.95 | 10.8 | |||||
| MIN | NOM | MAX | UNIT | ||
|---|---|---|---|---|---|
| f(SCLK) | Serial clock frequency | 50 | MHz | ||
| t1 | SCLK falling edge to SYNC falling edge (for successful write operation) | 10 | ns | ||
| t2 | SCLK cycle time | 20 | ns | ||
| t3 | SYNC rising edge to 23rd SCLK falling edge (for successful SYNC interrupt) | 13 | ns | ||
| t4 | Minimum SYNC HIGH time | 80 | ns | ||
| t5 | SYNC to SCLK falling edge setup time | 13 | ns | ||
| t6 | SCLK LOW time | 8 | ns | ||
| t7 | SCLK HIGH time | 8 | ns | ||
| t8 | SCLK falling edge to SYNC rising edge | 10 | ns | ||
| t9 | Data setup time | 6 | ns | ||
| t10 | Data hold time | 5 | ns | ||
| t11 | SCLK falling edge to LDAC falling edge for asynchronous LDAC update mode | 5 | ns | ||
| t12 | LDAC pulse duration, LOW time | 10 | ns | ||
| t13 | CLR pulse duration, LOW time | 80 | ns | ||
| t14 | CLR falling edge to start of VOUT transition | 100 | ns | ||

| MEASUREMENT | POWER-SUPPLY VOLTAGE | FIGURE NUMBER | |
|---|---|---|---|
| Internal Reference Voltage vs Temperature | 5.5 V | Figure 2 | |
| Internal Reference Voltage Temperature Drift Histogram | Figure 3 | ||
| Internal Reference Voltage vs Load Current | Figure 4 | ||
| Internal Reference Voltage vs Time | Figure 5 | ||
| Internal Reference Noise Density vs Frequency | Figure 6 | ||
| Internal Reference Voltage vs Supply Voltage | 2.7 V – 5.5 V | Figure 7 | |
| MEASUREMENT | POWER-SUPPLY VOLTAGE | FIGURE NUMBER | |
|---|---|---|---|
| FULL-SCALE, GAIN, OFFSET AND ZERO-CODE ERRORS | |||
| Full-Scale Error vs Temperature | 5.5 V | Figure 16 | |
| Gain Error vs Temperature | Figure 17 | ||
| Offset Error vs Temperature | Figure 18 | ||
| Zero-Code Error vs Temperature | Figure 19 | ||
| Full-Scale Error vs Temperature | 2.7 V | Figure 63 | |
| Gain Error vs Temperature | Figure 64 | ||
| Offset Error vs Temperature | Figure 65 | ||
| Zero-Code Error vs Temperature | Figure 66 | ||
| LOAD REGULATION | |||
| DAC Output Voltage vs Load Current | 5.5 V | Figure 30 | |
| 2.7 V | Figure 74 | ||
| DIFFERENTIAL NONLINEARITY ERROR | |||
| Differential Linearity Error vs Digital Input Code | T = –40°C | 5.5 V | Figure 9 |
| T = 25°C | Figure 11 | ||
| T = 125°C | Figure 13 | ||
| Differential Linearity Error vs Temperature | Figure 15 | ||
| Differential Linearity Error vs Digital Input Code | T = –40°C | 2.7 V | Figure 56 |
| T = 25°C | Figure 58 | ||
| T = 125°C | Figure 60 | ||
| Differential Linearity Error vs Temperature | Figure 62 | ||
| INTEGRAL NONLINEARITY ERROR (RELATIVE ACCURACY) | |||
| Linearity Error vs Digital Input Code | T = –40°C | 5.5 V | Figure 8 |
| T = 25°C | Figure 10 | ||
| T = 125°C | Figure 12 | ||
| Linearity Error vs Temperature | Figure 14 | ||
| Linearity Error vs Digital Input Code | T = –40°C | 2.7 V | Figure 55 |
| T = 25°C | Figure 57 | ||
| T = 125°C | Figure 59 | ||
| Linearity Error vs Temperature | Figure 61 | ||
| POWER-DOWN CURRENT | |||
| Power-Down Current vs Temperature | 5.5 V | Figure 28 | |
| Power-Down Current vs Power-Supply Voltage | 2.7 V – 5.5 V | Figure 29 | |
| Power-Down Current vs Temperature | 2.7 V | Figure 73 | |
| POWER-SUPPLY CURRENT | |||
| Power-Supply Current vs Temperature | External VREF | 5.5 V | Figure 20 |
| Internal VREF | Figure 21 | ||
| Power-Supply Current vs Digital Input Code | External VREF | Figure 22 | |
| Internal VREF | Figure 23 | ||
| Power-Supply Current Histogram | External VREF | Figure 24 | |
| Internal VREF | Figure 25 | ||
| Power-Supply Current vs Power-Supply Voltage | External VREF | 2.7 V – 5.5 V | Figure 26 |
| Internal VREF | Figure 27 | ||
| Power-Supply Current vs Temperature | External VREF | 3.6 V | Figure 49 |
| Internal VREF | Figure 50 | ||
| Power-Supply Current vs Digital Input Code | External VREF | Figure 51 | |
| Internal VREF | Figure 52 | ||
| Power-Supply Current Histogram | External VREF | Figure 53 | |
| Internal VREF | Figure 54 | ||
| Power-Supply Current vs Temperature | External VREF | 2.7 V | Figure 67 |
| Internal VREF | Figure 68 | ||
| Power-Supply Current vs Digital Input Code | External VREF | Figure 69 | |
| Internal VREF | Figure 70 | ||
| Power-Supply Current Histogram | External VREF | Figure 71 | |
| Internal VREF | Figure 72 | ||
| MEASUREMENT | POWER-SUPPLY VOLTAGE | FIGURE NUMBER | |
|---|---|---|---|
| CHANNEL-TO-CHANNEL CROSSTALK | |||
| Channel-to-Channel Crosstalk | 5-V Rising Edge | 5.5 V | Figure 43 |
| 5-V Falling Edge | Figure 44 | ||
| CLOCK FEEDTHROUGH | |||
| Clock Feedthrough | 500 kHz, Mid-Scale | 5.5 V | Figure 48 |
| 2.7 V | Figure 87 | ||
| GLITCH IMPULSE | |||
| Glitch Impulse, 1-LSB Step | Rising Edge, Code 7FFFh to 8000h | 5.5 V | Figure 37 |
| Falling Edge, Code 8000h to 7FFFh | Figure 38 | ||
| Glitch Impulse, 4-LSB Step | Rising Edge, Code 7FFCh to 8000h | Figure 39 | |
| Falling Edge, Code 8000h to 7FFCh | Figure 40 | ||
| Glitch Impulse, 16-LSB Step | Rising Edge, Code 7FF0h to 8000h | Figure 41 | |
| Falling Edge, Code 8000h to 7FF0h | Figure 42 | ||
| Glitch Impulse, 1-LSB Step | Rising Edge, Code 7FFFh to 8000h | 2.7 V | Figure 79 |
| Falling Edge, Code 8000h to 7FFFh | Figure 80 | ||
| Glitch Impulse, 4-LSB Step | Rising Edge, Code 7FFCh to 8000h | Figure 81 | |
| Falling Edge, Code 8000h to 7FFCh | Figure 82 | ||
| Glitch Impulse, 16-LSB Step | Rising Edge, Code 7FF0h to 8000h | Figure 83 | |
| Falling Edge, Code 8000h to 7FF0h | Figure 84 | ||
| NOISE | |||
| DAC Output Noise Density vs Frequency | External VREF | 5.5 V | Figure 45 |
| Internal VREF | Figure 46 | ||
| DAC Output Noise 0.1 Hz to 10 Hz | External VREF | Figure 47 | |
| POWER-ON GLITCH | |||
| Power-on Glitch | Reset to Zero Scale | 5.5 V | Figure 35 |
| Reset to Mid-Scale | Figure 36 | ||
| Reset to Zero Scale | 2.7 V | Figure 85 | |
| Reset to Mid-Scale | Figure 86 | ||
| SETTLING TIME | |||
| Full-Scale Settling Time | Rising Edge, Code 0h to FFFFh | 5.5 V | Figure 31 |
| Falling Edge, Code FFFFh to 0h | Figure 32 | ||
| Half-Scale Settling Time | Rising Edge, Code 4000h to C000h | Figure 33 | |
| Falling Edge, Code C000h to 4000h | Figure 34 | ||
| Full-Scale Settling Time | Rising Edge, Code 0h to FFFFh | 2.7 V | Figure 75 |
| Falling Edge, Code FFFFh to 0h | Figure 76 | ||
| Half-Scale Settling Time | Rising Edge, Code 4000h to C000h | Figure 77 | |
| Falling Edge, Code C000h to 4000h | Figure 78 | ||






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Figure 55. Linearity Error vs Digital Input Code (–40°C)
Figure 57. Linearity Error vs Digital Input Code (25°C)
Figure 59. Linearity Error vs Digital Input Code (125°C)
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Figure 56. Differential Linearity Error vs Digital Input Code (–40°C)
Figure 58. Differential Linearity Error vs Digital Input Code (25°C)
Figure 60. Differential Linearity Error vs Digital Input Code (125°C)
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