SBOS115B June   1999  – January 2026 INA133 , INA2133

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1.     7
    2. 5.1 Absolute Maximum Ratings
    3. 5.2 Recommended Operating Conditions
    4. 5.3 Thermal Information
    5. 5.4 Electrical Characteristics
    6. 5.5 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Gain Error and Drift
      2. 6.3.2 Input Voltage Range
    4. 6.4 Device Functional Modes
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1 Operating Voltage
      2. 7.1.2 Input Voltage
      3. 7.1.3 Offset Voltage Trim
    2. 7.2 Typical Application
    3. 7.3 Additional Applications
    4. 7.4 Power Supply Recommendations
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
      2. 7.5.2 Layout Examples
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Device Nomenclature
      2. 8.1.2 Development Support
        1. 8.1.2.1 PSpice® for TI
        2. 8.1.2.2 TINA-TI (Free Software Download)
    2. 8.2 Receiving Notification of Documentation Updates
    3. 8.3 Support Resources
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

9 Revision History

Changes from Revision A (March 2025) to Revision B (January 2026)

  • Added different fabrication process specification for slew rate in the Features Go
  • Added description of device flow information in Specifications Go
  • Added all chip site origins (CSO) condition to the typical test conditions in the Electrical Characteristics Go
  • Changed output voltage typical from "(V+) - 0.8" to "(V-) - 0.8" in the Electrical Characteristics Go
  • Added different fabrication process specifications for short circuit current, sinking and sourcing, in the Electrical Characteristics Go
  • Separated sinking and sourcing for short circuit current in the Electrical CharacteristicsGo
  • Changed 0.01% settling time test condition from "CL = 1000pF" to "CL = 100pF" in the Electrical CharacteristicsGo
  • Changed quiescent current test condition from "IO = 0V" to "IO = 0A" in the Electrical Characteristics Go
  • Added "CSO:SHE" to Total Harmonic Distortion + Noise vs Frequency, Voltage Noise Density vs Frequency, Slew Rate vs Temperature, Short-Circuit Current vs Temperature, Output Voltage Swing vs Output Current, and Large-Signal Step Response in the Typical Characteristics Go
  • Added Total Harmonic Distortion + Noise vs Frequency, Voltage Noise Density vs Frequency, Output Voltage Swing vs Output Current (Sinking), Output Voltage Swing vs Output Current (Sourcing), and Large-Signal Step Response in the Typical Characteristics Go
  • Added all chip site origins (CSO) condition to the typical test conditions in the Typical Characteristics Go
  • Change and added INA133 Internal Schematic for each fabrication process in the Functional Block Diagram Go
  • Changed "INA105" to "INA133" in the Power Supply Recommendations Go

Changes from Revision * (June 1999) to Revision A (March 2025)

  • Updated the numbering and format for tables, figures, and cross-references throughout the documentGo
  • Added the Pin Configuration and Functions, Specifications, Recommended Operating Conditions, Thermal Information, Detailed Description, Overview, Functional Block Diagram, Feature Description, Device Functional Modes, Application and Implementation, Power Supply Recommendations, Layout, Layout Guidelines, Layout Example, Device and Documentation Support, and Mechanical, Packaging, and Orderable Information sectionsGo
  • Changed the Package Information tableGo
  • Added Pin Functions table for INA133 and INA2133Go
  • Added test conditions to Electrical Characteristics tableGo
  • Combined VS=±15V and VS=±5V specification table in Electrical Characteristics Go
  • Changed parameter name in Electrical Characteristics from Offset Voltage Initial vs Temperature to Offset voltage drift Go
  • Changed parameter name in Electrical Characteristics from Offset Voltage Initial vs Power Supply to Power supply rejection ratio Go
  • Changed parameter name in Electrical Characteristics from Offset Voltage vs Time to Long-term stability Go
  • Changed parameter name in Electrical Characteristics from Current Limit, Continous-to-Common to Short-circuit current and added test condition Go
  • Moved the power supply and temperature ranges from the Electrical Characteristics table to the Recommended Operating Conditions and Absolute Maximum Ratings tableGo
  • Changed the Applications sectionGo