SNVS523G September   2007  – January 2018 LM3103

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Typical Application Schematic
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Functional Block Diagram
    2. 7.2 Feature Description
      1. 7.2.1  COT Control Circuit Overview
      2. 7.2.2  Startup Regulator (VCC)
      3. 7.2.3  Regulation Comparator
      4. 7.2.4  Zero Coil Current Detect
      5. 7.2.5  Over-Voltage Comparator
      6. 7.2.6  ON-Time Timer, Shutdown
      7. 7.2.7  Current Limit
      8. 7.2.8  N-Channel MOSFET and Driver
      9. 7.2.9  Soft-Start
      10. 7.2.10 Thermal Protection
  8. 8 Applications and Implementation
    1. 8.1 Application Information
      1. 8.1.1 External Components
  9. 9 Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Community Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  10. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MINMAXUNIT
VIN, RON to AGND –0.3 43.5 V
SW to AGND –0.3 43.5 V
SW to AGND (Transient) –2 (< 100 ns) V
VIN to SW –0.3 43.5 V
BST to SW –0.3 7 V
VCC to AGND –0.3 7 V
FB to AGND –0.3 5 V
All Other Inputs to AGND –0.3 7 V
Junction Temperature, TJ 150 °C
Storage Temperature, Tstg –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.