SGLS302G March   2005  – May 2020 TL431-Q1 , TL432-Q1

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
    1.     Device Images
      1.      Simplified Schematic
  4. Revision History
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: TL43x-Q1
    6. 6.6 Electrical Characteristics: TL43xA-Q1
    7. 6.7 Electrical Characteristics: TL43xB-Q1
    8. 6.8 Typical Characteristics
  7. Parameter Measurement Information
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
    4. 8.4 Device Functional Modes
      1. 8.4.1 Open Loop (Comparator)
      2. 8.4.2 Closed Loop
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Comparator Application
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
          1. 9.2.1.2.1 Basic Operation
          2. 9.2.1.2.2 Overdrive
          3. 9.2.1.2.3 Output Voltage and Logic Input Level
          4. 9.2.1.2.4 Input Resistance
          5. 9.2.1.2.5 Deviation Parameters and Calculating Dynamic Impedance
        3. 9.2.1.3 Application Curve
      2. 9.2.2 Other Application Circuits
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Related Links
    3. 12.3 Receiving Notification of Documentation Updates
    4. 12.4 Community Resources
    5. 12.5 Trademarks
    6. 12.6 Electrostatic Discharge Caution
    7. 12.7 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • DBZ|3
  • DBV|5
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Parameter Measurement Information

TL431-Q1 TL432-Q1 test_cir__for_equiv_input_noise_voltage_SGLS302.gifFigure 14. Test Circuit for Equivalent Input Noise Voltage
TL431-Q1 TL432-Q1 test_cir_for_voltage_amp_SGLS302.gifFigure 15. Test Circuit for Voltage Amplification
TL431-Q1 TL432-Q1 test_cir_for_ref_impedance_SGLS302.gifFigure 16. Test Circuit for Reference Impedance
TL431-Q1 TL432-Q1 test_cir_for_pulse_response_SGLS302.gifFigure 17. Test Circuit for Pulse Response
TL431-Q1 TL432-Q1 test_cir_for_curve_A_graph_1.gifFigure 18. Test Circuit for Curve A
TL431-Q1 TL432-Q1 test_cir_for_curve_A_graph_2.gifFigure 19. Test Circuit for Curves B, C, and D
TL431-Q1 TL432-Q1 test_cir_for_vka_equal_to_Vref_SGLS302.gifFigure 20. Test Circuit for VKA = VREF
TL431-Q1 TL432-Q1 test_cir_vka_greater_than_vref_SGLS302.gifFigure 21. Test Circuit for VKA > VREF
TL431-Q1 TL432-Q1 test_cir_for_Ioff_SGLS302.gifFigure 22. Test Circuit for IOFF