SBOSA24A July   2023  – December 2023 TMCS1123

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Insulation Specifications
    6. 6.6 Electrical Characteristics
    7. 6.7 Typical Characteristics
  8. 7 Parameter Measurement Information
    1. 7.1 Accuracy Parameters
      1. 7.1.1 Sensitivity Error
      2. 7.1.2 Offset Error and Offset Error Drift
      3. 7.1.3 Nonlinearity Error
      4. 7.1.4 Power Supply Rejection Ratio
      5. 7.1.5 Common-Mode Rejection Ratio
      6. 7.1.6 External Magnetic Field Errors
    2. 7.2 Transient Response Parameters
      1. 7.2.1 CMTI, Common-Mode Transient Immunity
    3. 7.3 Safe Operating Area
      1. 7.3.1 Continuous DC or Sinusoidal AC Current
      2. 7.3.2 Repetitive Pulsed Current SOA
      3. 7.3.3 Single Event Current Capability
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Current Input
      2. 8.3.2 Input Isolation
      3. 8.3.3 Ambient Field Rejection
      4. 8.3.4 High-Precision Signal Chain
        1. 8.3.4.1 Temperature Stability
        2. 8.3.4.2 Lifetime and Environmental Stability
      5. 8.3.5 Internal Reference Voltage
      6. 8.3.6 Current-Sensing Measurable Ranges
      7. 8.3.7 Overcurrent Detection
      8. 8.3.8 Sensor Diagnostics
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power-Down Behavior
  10. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Total Error Calculation Examples
        1. 9.1.1.1 Room-Temperature Error Calculations
        2. 9.1.1.2 Full-Temperature Range Error Calculations
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Device Support
      1. 10.1.1 Development Support
    2. 10.2 Documentation Support
      1. 10.2.1 Related Documentation
    3. 10.3 Receiving Notification of Documentation Updates
    4. 10.4 Support Resources
    5. 10.5 Trademarks
    6. 10.6 Electrostatic Discharge Caution
    7. 10.7 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.3.4.2 Lifetime and Environmental Stability

In addition to large thermal drift, typical magnetic current sensors suffer an additional 2% to 3% drift in sensitivity due to aging over the lifetime of the device. The same proprietary compensation techniques used in the TMCS1123 to reduce temperature drift are also used to greatly reduce lifetime drift due to aging from stress and environmental conditions especially at high operating temperatures. As shown in the Electrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical Characteristics, the TMCS1123 has industry leading lifetime sensitivity drift realized after Highly Accelerated Stress Tests (HAST) at 130°C and 85% relative humidity (RH) during standard three lot AEC-Q100 qualifications. Low sensitivity and offset drift within the bounds specified in the Electrical CharacteristicsElectrical CharacteristicsElectrical CharacteristicsElectrical Characteristics are also observed after 1000 hour, 125°C high temperature operating life stress tests are performed as prescribed by AEC-Q100 qualifications. These tests mimic typical device lifetime operation, and show device performance variation due to aging is vastly improved compared with typical magnetic current sensors. Figure 8-2 and Figure 8-3 show the sensitivity and offset drift after a 1000 hour, 125°C high temperature operating life stress test as specified by AEC-Q100. This test mimics typical device lifetime operation, and shows the likely device performance variation due to aging is vastly improved compared to typical magnetic sensors.

GUID-20231219-SS0I-F6QX-2KVV-Q7GSR37QRDZB-low.pngFigure 8-2 Sensitivity Error Drift After AEC-Q100 High Temperature Operating Life Stress Test
GUID-20231219-SS0I-SJTF-41GW-9X5WS46TNF0R-low.svgFigure 8-3 Input-Referred Offset Drift After AEC-Q100 High Temperature Operating Life Stress Test