7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
|
MIN |
MAX |
UNIT |
Voltage(2) |
VIN, CTRL, PWM, FB |
–0.3 |
7 |
V |
SW |
–0.3 |
40 |
PD |
Continuous power dissipation |
See Thermal Information Table |
|
TJ |
Operating junction temperature |
–40 |
150 |
°C |
Tstg |
Storage temperature |
–65 |
150 |
°C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
7.4 Thermal Information
THERMAL METRIC(1) |
TPS61169 |
UNIT |
DCK (SC70) |
5 PINS |
RθJA |
Junction-to-ambient thermal resistance(2) |
263.8 |
°C/W |
RθJC(top) |
Junction-to-case (top) thermal resistance(3) |
76.1 |
°C/W |
RθJB |
Junction-to-board thermal resistance(4) |
51.4 |
°C/W |
ψJT |
Junction-to-top characterization parameter(5) |
1.1 |
°C/W |
ψJB |
Junction-to-board characterization parameter(6) |
50.7 |
°C/W |
(1) For more information about traditional and new thermal metrics, see the
Semiconductor and IC Package Thermal Metrics application report,
SPRA953.
(2) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a.
(3) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8.
(5) The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining R θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6) The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining RθJA , using a procedure described in JESD51-2a (sections 6 and 7).