SBVS128F June 2009 – December 2015 TPS727
Application report SLAA414, LDO PSRR Measurement Simplified.
Application report SLAA412, LDO Noise Demystified.
User guide SLVU323, TPS727xxYFF EVM
User guide SLVU325, TPS727xxDSE EVM
|TPS727xxx yyy z|| XXX is the nominal output voltage.
YYY is package designator.
Z is package tape and reel quantity (R = 3000, T = 250).
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.