SCDS387 October   2018 TS3A5017-Q1

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Device Images
      1.      Block Diagram
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics for 3.3-VSupply
    6. 6.6 Electrical Characteristics for 2.5-VSupply
    7. 6.7 Switching Characteristics for 3.3-VSupply
    8. 6.8 Switching Characteristics for 2.5-VSupply
    9. 6.9 Typical Characteristics
  7. 7 Parameter Measurement Information
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
    4. 8.4 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 Receiving Notification of Documentation Updates
    4. 12.4 Community Resources
    5. 12.5 Trademarks
    6. 12.6 Electrostatic Discharge Caution
    7. 12.7 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)(2)
MIN MAX UNIT
V+ Supply voltage(3) –0.5 4.6 V
VS, VD Analog voltage(3)(4) –0.5 4.6 V
ISK, IDK Analog port clamp current VS, VD < 0 –50 mA
IS, ID ON-state switch current VS, VD = 0 to 7 V –128 128 mA
VI Digital input voltage –0.5 4.6 V
IIK Digital input clamp current(3)(4) VI < 0 –50 mA
I+ Continuous current through V+ 100 mA
IGND Continuous current through GND –100 mA
Tstg Storage temperature –65 150 °C
(1) Stresses beyond those listed underAbsolute Maximum Ratings may cause permanent damage to thedevice. These are stress ratings only, and functional operation of the device at these or any otherconditions beyond those indicated under Recommended OperatingConditions is not implied. Exposure to absolute-maximum-rated conditions for extendedperiods may affect device reliability.
(2) The algebraic convention, whereby the most negative value is aminimum and the most positive value is a maximum.
(3) All voltages are with respect to ground, unless otherwisespecified.
(4) The input and output voltage ratings may be exceeded if theinput and output clamp-current ratings are observed.