SLUS495J August   2001  – December 2023 UCC29002 , UCC39002

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Pin Configuration and Functions
    1.     Pin Functions
  6. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Typical Characteristics
  7. 6Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Differential Current-Sense Amplifier (CS+, CS−, CSO)
      2. 6.3.2 Load-Share Bus Driver Amplifier (CSO, LS)
      3. 6.3.3 Load-Share Bus Receiver Amplifier (LS)
      4. 6.3.4 Error Amplifier (EAO)
      5. 6.3.5 Adjust Amplifier Output (ADJ)
      6. 6.3.6 Enable Function (CS+, CS−)
      7. 6.3.7 Fault Protection on LS Bus
      8. 6.3.8 Start-Up and Adjust Logic
      9. 6.3.9 Bias Input and Bias_OK Circuit (VDD)
    4. 6.4 Device Functional Modes
      1. 6.4.1 Start-Up Mode
      2. 6.4.2 Normal Running Mode
      3. 6.4.3 Fault Mode
      4. 6.4.4 Disabled Mode
  8. 7Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Paralleling the Power Modules
    3. 7.3 Typical Application
      1. 7.3.1 Measuring the Voltage Loop of a Power Module
      2. 7.3.2 Detailed Design Procedure
        1. 7.3.2.1 The Shunt Resistor
        2. 7.3.2.2 The CSA Gain
        3. 7.3.2.3 Determining RADJ
        4. 7.3.2.4 Error Amplifier Compensation
      3. 7.3.3 Application Curve
    4. 7.4 Power Supply Recommendations
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
      2. 7.5.2 Layout Example
  9. 8Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
      1. 8.1.1 Documentation Support
    2. 8.2 Related Links
    3. 8.3 Support Resources
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 Glossary
  10. 9Revision History
  11.   Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.5 Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.