SLLSEK5B July   2015  – May 2017 ISO7340-Q1 , ISO7341-Q1 , ISO7342-Q1

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Description (continued)
  6. Pin Configuration and Functions
  7. Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Power Ratings
    6. 7.6  Insulation Specifications
    7. 7.7  Safety-Related Certifications
    8. 7.8  Safety Limiting Values
    9. 7.9  Electrical Characteristics—5-V Supply
    10. 7.10 Supply Current Characteristics—5-V Supply
    11. 7.11 Electrical Characteristics—3.3-V Supply
    12. 7.12 Supply Current Characteristics—3.3-V Supply
    13. 7.13 Switching Characteristics—5-V Supply
    14. 7.14 Switching Characteristics—3.3-V Supply
    15. 7.15 Insulation Characteristics Curves
    16. 7.16 Typical Characteristics
  8. Parameter Measurement Information
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Electromagnetic Compatibility (EMC) Considerations
    4. 9.4 Device Functional Modes
      1. 9.4.1 Device I/O Schematics
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Isolated Data Acquisition System for Process Control
        1. 10.2.1.1 Design Requirements
        2. 10.2.1.2 Detailed Design Procedure
          1. 10.2.1.2.1 Typical Supply Current Equations
            1. 10.2.1.2.1.1 ISO7340-Q1
            2. 10.2.1.2.1.2 ISO7341-Q1
            3. 10.2.1.2.1.3 ISO7342-Q1
        3. 10.2.1.3 Application Curves
      2. 10.2.2 Typical Application for Module With 16 Inputs
        1. 10.2.2.1 Design Requirements
        2. 10.2.2.2 Detailed Design Procedure
        3. 10.2.2.3 Application Curves
      3. 10.2.3 Typical Application for RS-232 Interface
        1. 10.2.3.1 Design Requirements
        2. 10.2.3.2 Detailed Design Procedure
        3. 10.2.3.3 Application Curves
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
      1. 12.1.1 PCB Material
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 Related Links
    3. 13.3 Receiving Notification of Documentation Updates
    4. 13.4 Community Resource
    5. 13.5 Trademarks
    6. 13.6 Electrostatic Discharge Caution
    7. 13.7 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

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発注情報

Specifications

Absolute Maximum Ratings

See (1)
MIN MAX UNIT
VCC Supply voltage(2) VCC1, VCC2 –0.5 6 V
Voltage INx, OUTx, ENx –0.5 VCC + 0.5(3) V
IO Output current ±15 mA
TJ Maximum junction temperature 150 °C
Tstg Storage temperature –65 150 °C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values except differential I/O bus voltages are with respect to the local ground terminal (GND1 or GND2) and are peak voltage values.
Maximum voltage must not exceed 6 V.

ESD Ratings

VALUE UNIT
V(ESD) Electrostatic discharge Human-body model (HBM), per AEC Q100-002(1) ±4000 V
Charged-device model (CDM), per AEC Q100-011 ±1500
AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

Recommended Operating Conditions

MIN NOM MAX UNIT
VCC1, VCC2 Supply voltage 3 5.5 V
IOH High-level output current –4 mA
IOL Low-level output current 4 mA
VIH High-level input voltage 2 5.5 V
VIL Low-level input voltage 0 0.8 V
tui Input pulse duration 40 ns
1 / tui Signaling rate 0 25 Mbps
TJ Junction temperature(1) 136 °C
TA Ambient temperature –40 25 125 °C
To maintain the recommended operating conditions for TJ, see the Thermal Information table.

Thermal Information

THERMAL METRIC(1) ISO734x-Q1 UNIT
DW (SOIC)
16 PINS
RθJA Junction-to-ambient thermal resistance 78.4 °C/W
RθJC(top) Junction-to-case(top) thermal resistance 41 °C/W
RθJB Junction-to-board thermal resistance 43 °C/W
ψJT Junction-to-top characterization parameter 15.6 °C/W
ψJB Junction-to-board characterization parameter 42.5 °C/W
RθJC(bottom) Junction-to-case(bottom) thermal resistance n/a °C/W
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.

Power Ratings

VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF, Input a 12.5-MHz 50% duty cycle square wave
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
PD Maximum power dissipation by both sides of ISO7340-Q1 92 mW
PD1 Maximum power dissipation by side-1 of ISO7340-Q1 24
PD2 Maximum power dissipation by side-2 of ISO7340-Q1 68
PD Maximum power dissipation by both sides of ISO7341-Q1 102 mW
PD1 Maximum power dissipation by side-1 of ISO7341-Q1 42
PD2 Maximum power dissipation by side-2 of ISO7341-Q1 60
PD Maximum power dissipation by both sides of ISO7342-Q1 111 mW
PD1 Maximum power dissipation by side-1 of ISO7342-Q1 55.5
PD2 Maximum power dissipation by side-2 of ISO7342-Q1 55.5

Insulation Specifications

PARAMETER TEST CONDITIONS VALUE UNIT
GENERAL
CLR External clearance(1) Shortest terminal-to-terminal distance through air >8 mm
CPG External creepage(1) Shortest terminal-to-terminal distance across the package surface >8 mm
DTI Distance through the insulation Minimum internal gap (internal clearance) >13 µm
CTI Comparative tracking index DIN EN 60112 (VDE 0303-11); IEC 60112 >400 V
Material group II
Overvoltage Category Rated mains voltage ≤ 300 VRMS I–IV
Rated mains voltage ≤ 600 VRMS I–III
Rated mains voltage ≤ 1000 VRMS I-II
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12(2)
VIORM Maximum repetitive peak isolation voltage AC voltage (bipolar) 1414 VPK
VIOTM Maximum transient isolation voltage VTEST = VIOTM;
t = 60 s (qualification); t = 1 s (100% production)
4242 VPK
VIOSM Maximum surge isolation voltage(3) Test method per IEC 60065, 1.2/50 µs waveform,
VTEST = 1.3 × VIOSM = 7800 VPK (qualification)
6000 VPK
qpd Apparent charge(4) Method a: After I/O safety test subgroup 2/3,
Vini = VIOTM, tini = 60 s;
Vpd(m) = 1.2 × VIORM = 1697 VPK, tm = 10 s
≤5 pC
Method a: After environmental tests subgroup 1,
Vini = VIOTM, tini = 60 s;
Vpd(m) = 1.6 × VIORM = 2262 VPK, tm = 10 s
≤5
Method b1: At routine test (100% production) and preconditioning (type test) Vini = VIOTM, tini = 1 s;
Vpd(m) = 1.875 × VIORM = 2651 VPK, tm = 1 s (100% production)
≤5
CIO Barrier capacitance, input to output(5) VIO = 0.4 sin (2πft), f = 1 MHz 2.4 pF
RIO Isolation resistance, input to output(5) VIO = 500 V, TA = 25°C >1012 Ω
VIO = 500 V, 100°C ≤ TA ≤ x°C >1011
VIO = 500 V at TS = 150°C >109
Pollution degree 2
Climatic category 40/125/21
UL 1577
VISO Withstand isolation voltage VTEST = VISO = 3000 VRMS, t = 60 s (qualification); VTEST = 1.2 × VISO = 3600 VRMS, t = 1 s (100% production) 3000 VRMS
Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed-circuit board do not reduce this distance. Creepage and clearance on a printed-circuit board become equal in certain cases. Techniques such as inserting grooves and/or ribs on a printed circuit board are used to help increase these specifications.
This coupler is suitable for safe electrical insulation only within the maximum operating ratings. Compliance with the safety ratings shall be ensured by means of suitable protective circuits.
Testing is carried out in air or oil to determine the intrinsic surge immunity of the isolation barrier.
Apparent charge is electrical discharge caused by a partial discharge (pd).
All pins on each side of the barrier tied together creating a two-terminal device

Safety-Related Certifications

VDE CSA UL CQC
Certified according to DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 and DIN EN 61010-1 (VDE 0411-1):2011-07 Approved under CSA Component Acceptance Notice 5A, IEC 60950-1, and IEC 61010-1 Recognized component under UL 1577 Certified according to GB4943.1-2011
Basic Insulation;
Maximum Transient Overvoltage, 4242 VPK;
Maximum Surge Isolation Voltage, 6000 VPK;
Maximum Repetitive Peak Isolation Voltage, 1414 VPK
800 VRMS Basic Insulation and 400 VRMS Reinforced Insulation working voltage per CSA 60950-1-07+A1+A2 and IEC 60950-1 2nd Ed.+A1+A2;
300 VRMS Basic Insulation working voltage per CSA 61010-1-12 and IEC 61010-1 3rd Ed.

Single protection, 3000 VRMS
Reinforced Insulation, Altitude ≤ 5000 m, Tropical Climate, 250 VRMS maximum working voltage
Certificate number: 40016131 Master contract number: 220991 File number: E181974 Certificate number: CQC15001121716

Safety Limiting Values

Safety limiting(1) intends to minimize potential damage to the isolation barrier upon failure of input or output circuitry. A failure of the I/O can allow low resistance to ground or the supply and, without current limiting, dissipate sufficient power to overheat the die and damage the isolation barrier, potentially leading to secondary system failures.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
IS Safety input, output, or supply current RθJA = 78.4 °C/W, VI = 5.5 V, TJ = 150°C, TA = 25°C, see Figure 1 290 mA
RθJA = 78.4 °C/W, VI = 3.6 V, TJ = 150°C, TA = 25°C, see Figure 1 443
TS Safety temperature 150
The safety-limiting constraint is the maximum junction temperature specified in the data sheet. The power dissipation and junction-to-air thermal impedance of the device installed in the application hardware determines the junction temperature. The assumed junction-to-air thermal resistance in the Thermal Information table is that of a device installed on a high-K test board for leaded surface-mount packages. The power is the recommended maximum input voltage times the current. The junction temperature is then the ambient temperature plus the power times the junction-to-air thermal resistance.

Electrical Characteristics—5-V Supply

VCC1 and VCC2 at 5 V ± 10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VOH High-level output voltage IOH = –4 mA; see Figure 14 VCCO(1) – 0.5 4.7 V
IOH = –20 μA; see Figure 14 VCCO(1) – 0.1 5
VOL Low-level output voltage IOL = 4 mA; see Figure 14 0.2 0.4 V
IOL = 20 μA; see Figure 14 0 0.1
VI(HYS) Input threshold voltage hysteresis 480 mV
IIH High-level input current VIH = VCC at INx or ENx 10 μA
IIL Low-level input current VIL = 0 V at INx or ENx –10 μA
CMTI Common-mode transient immunity VI = VCC or 0 V; see Figure 17 25 70 kV/μs
CI Input capacitance(2) VI = VCC/2 + 0.4 sin (2πft), f = 1 MHz, VCC = 5 V 3.4 pF
VCCO is supply voltage, VCC1 or VCC2, for the output channel being measured.
Measured from input pin to ground.

Supply Current Characteristics—5-V Supply

All inputs switching with square wave clock signal for dynamic ICC measurement. VCC1 and VCC2 at 5 V ± 10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS SUPPLY CURRENT MIN TYP MAX UNIT
ISO7340-Q1
Supply current EN = 0 V Disable ICC1 0.6 1.4 mA
ICC2 0.4 0.8
DC Signal: VI = VCC or 0 V,
AC Signal: All channels switching with square wave clock input; CL = 15 pF
DC to 1 Mbps ICC1 0.6 1.4
ICC2 3.2 4.8
10 Mbps ICC1 1.4 2.3
ICC2 5.6 7.1
25 Mbps ICC1 2.7 4
ICC2 9.3 12
ISO7341-Q1
Supply current EN1 = EN2 = 0 V Disable ICC1 0.8 1.8 mA
ICC2 0.7 1.3
DC Signal: VI = VCC or 0 V,
AC Signal: All channels switching with square wave clock input; CL = 15 pF
DC to 1 Mbps ICC1 2 3.2
ICC2 2.9 4.4
10 Mbps ICC1 3.2 4.5
ICC2 4.9 6.5
25 Mbps ICC1 5 7
ICC2 7.8 11
ISO7342-Q1
Supply current EN1 = EN2 = 0 V Disable ICC1, ICC2 0.7 1.6 mA
DC Signal: VI = VCC or 0 V,
AC Signal: All channels switching with square wave clock input; CL = 15 pF
DC to 1 Mbps ICC1, ICC2 2.5 4
10 Mbps ICC1, ICC2 4.1 5.6
25 Mbps ICC1, ICC2 6.4 9

Electrical Characteristics—3.3-V Supply

VCC1 and VCC2 at 3.3 V ± 10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VOH High-level output voltage IOH = –4 mA; see Figure 14 VCCO(1) – 0.5 3 V
IOH = –20 μA; see Figure 14 VCCO(1) – 0.1 3.3
VOL Low-level output voltage IOL = 4 mA; see Figure 14 0.2 0.4 V
IOL = 20 μA; see Figure 14 0 0.1
VI(HYS) Input threshold voltage hysteresis 450 mV
IIH High-level input current VIH = VCC at INx or ENx 10 μA
IIL Low-level input current VIL = 0 V at INx or ENx –10 μA
CMTI Common-mode transient immunity VI = VCC or 0 V; see Figure 17 25 50 kV/μs
VCCO is supply voltage, VCC1 or VCC2, for the output channel being measured.

Supply Current Characteristics—3.3-V Supply

All inputs switching with square wave clock signal for dynamic ICC measurement. VCC1 and VCC2 at 3.3 V ± 10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS SUPPLY CURRENT MIN TYP MAX UNIT
ISO7340-Q1
Supply current EN = 0 V Disable ICC1 0.4 0.7 mA
ICC2 0.3 0.6
DC Signal: VI = VCC or 0 V,
AC Signal: All channels switching with square wave clock input; CL = 15 pF
DC to 1 Mbps ICC1 0.4 0.7
ICC2 2.3 3.6
10 Mbps ICC1 0.9 1.3
ICC2 3.9 5.1
25 Mbps ICC1 1.6 2.4
ICC2 6.3 8
ISO7341-Q1
Supply current EN1 = EN2 = 0 V Disable ICC1 0.6 1 mA
ICC2 0.5 0.8
DC Signal: VI = VCC or 0 V,
AC Signal: All channels switching with square wave clock input; CL = 15 pF
DC to 1 Mbps ICC1 1.4 2.3
ICC2 2.2 3.2
10 Mbps ICC1 2.2 3
ICC2 3.4 4.5
25 Mbps ICC1 3.3 4.7
ICC2 5.2 7.2
ISO7342-Q1
Supply current EN1 = EN2 = 0 V Disable ICC1, ICC2 0.5 0.9 mA
DC Signal: VI = VCC or 0 V,
AC Signal: All channels switching with square wave clock input; CL = 15 pF
DC to 1 Mbps ICC1, ICC2 1.8 2.8
10 Mbps ICC1, ICC2 2.8 4
25 Mbps ICC1, ICC2 4.3 5.8

Switching Characteristics—5-V Supply

VCC1 and VCC2 at 5 V ± 10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay time See Figure 14 20 31 58 ns
PWD(1) Pulse width distortion |tPHL – tPLH| 4 ns
tsk(o)(2) Channel-to-channel output skew time Same-direction Channels 2.5 ns
Opposite-direction Channels 17 ns
tsk(pp)(3) Part-to-part skew time 23 ns
tr Output signal rise time See Figure 14 2.1 ns
tf Output signal fall time 1.7 ns
tPHZ Disable propagation delay, high-to-high impedance output See Figure 15 7 13 ns
tPLZ Disable propagation delay, low-to-high impedance output 7 13 ns
tPZH Enable propagation delay, high impedance-to-high output ISO734xCQDWQ1 and ISO734xCQDWRQ1 7 13 ns
ISO734xFCQDWQ1 and ISO734xFCQDWRQ1 15000 23000(4)
tPZL Enable propagation delay, high impedance-to-low output ISO734xCQDWQ1 and ISO734xCQDWRQ1 15000 23000(4) ns
ISO734xFCQDWQ1 and ISO734xFCQDWRQ1 7 13
tfs Fail-safe output delay time from input power loss See Figure 16 9.4 μs
Also known as Pulse Skew.
tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same direction while driving identical loads.
tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same direction while operating at identical supply voltages, temperature, input signals and loads.
The enable signal rate should be ≤ 43 Kbps.

Switching Characteristics—3.3-V Supply

VCC1 and VCC2 at 3.3 V ± 10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay time See Figure 14 22 35 66 ns
PWD(1) Pulse width distortion |tPHL – tPLH| 2.5
tsk(o) (2) Channel-to-channel output skew time Same-direction Channels 3
Opposite-direction Channels 16
tsk(pp) (3) Part-to-part skew time 28
tr Output signal rise time See Figure 14 2.8 ns
tf Output signal fall time 2.1
tPHZ Disable propagation delay, high-to-high impedance output See Figure 15 9 18 ns
tPLZ Disable propagation delay, low-to-high impedance output 9 18
tPZH Enable propagation delay, high impedance-to-high output ISO734xCQDWQ1 and ISO734xCQDWRQ1 9 18
ISO734xFCQDWQ1 and ISO734xFCQDWRQ1 16000 24000(4)
tPZL Enable propagation delay, high impedance-to-low output ISO734xCQDWQ1 and ISO734xCQDWRQ1 16000 24000(4)
ISO734xFCQDWQ1 and ISO734xFCQDWRQ1 9 18
tfs Fail-safe output delay time from input power loss See Figure 16 9.4 μs
Also known as Pulse Skew.
tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same direction while driving identical loads.
tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same direction while operating at identical supply voltages, temperature, input signals and loads.
The enable signal rate should be ≤ 45 Kbps.

Insulation Characteristics Curves

ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D001_sllsek5.gif
Figure 1. Thermal Derating Curve for Limiting Current per VDE

Typical Characteristics

ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D012_SLLSEI6.gif
TA = 25°C CL = 15 pF
Figure 2. ISO7340-Q1 Supply Current vs Data Rate
(15-pF Load)
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D010_SLLSEI6.gif
TA = 25°C CL = 15 pF
Figure 4. ISO7341x-Q1 Supply Current vs Data Rate
(15-pF Load)
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D001_SLLSEI6.gif
TA = 25°C CL = 15 pF
Figure 6. ISO7342x-Q1 Supply Current vs Data Rate
(15-pF Load)
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D003_SLLSEI6.gif
TA = 25°C
Figure 8. High-Level Output Voltage vs High-level Output Current
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D005_SLLSEI6.gif
Figure 10. Power Supply Undervoltage Threshold vs Free-Air Temperature
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D007_SLLSEI6.gif
Figure 12. Input Glitch Suppression Time vs Free-Air Temperature
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D013_SLLSEI6.gif
TA = 25°C CL = No Load
Figure 3. ISO7340-Q1 Supply Current vs Data Rate
(No Load)
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D011_SLLSEI6.gif
TA = 25°C CL = No Load
Figure 5. ISO7341x-Q1 Supply Current vs Data Rate
(No Load)
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D002_SLLSEI6.gif
TA = 25°C CL = No Load
Figure 7. ISO7342x-Q1 Supply Current vs Data Rate
(No Load)
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D004_SLLSEI6.gif
TA = 25°C
Figure 9. Low-Level Output Voltage vs Low-Level Output Current
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D006_SLLSEI6.gif
Figure 11. Propagation Delay Time vs Free-Air Temperature
ISO7340-Q1 ISO7341-Q1 ISO7342-Q1 D008_SLLSEI6.gif
TA = 25°C
Figure 13. Output Jitter vs Data Rate