SNIS161D March   2000  – January  2016 LM34

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: LM34A and LM34CA
    6. 6.6 Electrical Characteristics: LM34, LM34C, and LM34D
    7. 6.7 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Capacitive Drive Capability
      2. 7.3.2 LM34 Transfer Function
    4. 7.4 Device Functional Modes
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Basic Fahrenheit Temperature Sensor Application
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curve
    3. 8.3 System Examples
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Trademarks
    2. 11.2 Electrostatic Discharge Caution
    3. 11.3 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

6 Specifications

6.1 Absolute Maximum Ratings(1)(2)

over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
Supply voltage 35 –0.2 V
Output voltage 6 –1 V
Output current 10 mA
Storage temperature, Tstg TO-46 Package −76 356 °F
TO-92 Package −76 300
SO-8 Package −65 150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) If Military/Aerospace specified devices are required, contact the Texas Instruments Sales Office/ Distributors for availability and specifications.

6.2 ESD Ratings

VALUE UNIT
V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2500 V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
Specified operating temperature range
(TMIN ≤ TA ≤ TMAX) 		LM34, LM34A –50 300 °F
LM34C, LM34CA –40 230
LM34D 32 212
Supply Voltage Range (+VS) 4 30 V

6.4 Thermal Information

THERMAL METRIC(1) LM34 UNIT
NDV (TO-46) LP (TO-92) D (SO8)
3 PINS 3 PINS 8 PINS
RθJA Junction-to-ambient thermal resistance 720 324 400 °F/W
RθJC Junction-to-case thermal resistance 43 — —
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.

6.5 Electrical Characteristics: LM34A and LM34CA

Unless otherwise noted, these specifications apply: −50°F ≤ TJ ≤ 300°F for the LM34 and LM34A; −40°F ≤ TJ ≤ 230°F for the LM34C and LM34CA; and 32°F ≤ TJ ≤ 212°F for the LM34D. VS = 5 Vdc and ILOAD = 50 µA in the circuit of Full-Range Fahrenheit Temperature Sensor; 6 Vdc for LM34 and LM34A for 230°F ≤ TJ ≤ 300°F. These specifications also apply from 5°F to TMAX in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F).
PARAMETER TEST CONDITIONS LM34A LM34CA UNIT
MIN TYP MAX MIN TYP MAX
Accuracy(3) TA = 77°F Tested Limit(1) –1 1 –1 1 °F
Design Limit(2)
±0.4 ±0.4
T A = 0°F Tested Limit °F
Design Limit –2 2
±0.6 ±0.6
TA = TMAX Tested Limit –2 2 –2 2 °F
Design Limit
±0.8 ±0.8
TA = TMIN Tested Limit –2 2 °F
Design Limit –3 3
±0.8 ±0.8
Nonlinearity (4) Tested Limit °F
Design Limit –0.7 0.7 –0.6 0.6
TA = 77°F ±0.35 ±0.3
Sensor gain (Average Slope) Tested Limit 9.9 10.1 mV/°F
Design Limit +9.9 10.1
TA = 77°F +10 10
Load regulation(5) TA = 77°F
0 ≤ IL ≤ 1 mA		 Tested Limit –1 1 –1 1 mV/mA
Design Limit
±0.4 ±0.4
0 ≤ IL ≤ 1 mA Tested Limit mV/mA
Design Limit –3 3 –3 3
±0.5 ±0.5
Line regulation(5) TA = 77°F
5 V ≤ VS ≤ 30 V		 Tested Limit –0.05 0.05 –0.05 0.05 mV/V
Design Limit
±0.01 ±0.01
5 V ≤ VS ≤ 30 V Tested Limit mV/V
Design Limit –0.1 0.1 –0.1 0.1
±0.02 ±0.02
Quiescent current(6) VS = 5 V, TA = 77°F Tested Limit 90 90 µA
Design Limit
75 75
VS = 5 V Tested Limit µA
Design Limit 160 139
131 116
VS = 30 V, TA = 77°F Tested Limit 92 92 µA
Design Limit
76 76
VS = 30 V Tested Limit µA
Design Limit 163 142
132 117
Change of quiescent current(5) 4 V ≤ VS ≤ 30 V, TA = 77°F Tested Limit 2 2 µA
Design Limit
0.5 0.5
5 V ≤ VS ≤ 30 V Tested Limit µA
Design Limit 3 3
1 1
Temperature coefficient of quiescent current Tested Limit µA/°F
Design Limit 0.5 0.5
0.3 0.3
Minimum temperature for rated accuracy In circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F), IL = 0
TA = 77°F		 Tested Limit °F
Design Limit 5 5
3 3
Long-term stability TJ = TMAX for 1000 hours ±0.16 ±0.16 °F
(1) Tested limits are specified and 100% tested in production.
(2) Design limits are specified (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(3) Accuracy is defined as the error between the output voltage and 10 mV/°F times the device’s case temperature at specified conditions of voltage, current, and temperature (expressed in °F).
(4) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the rated temperature range of the device.
(5) Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(6) Quiescent current is defined in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F).

6.6 Electrical Characteristics: LM34, LM34C, and LM34D

Unless otherwise noted, these specifications apply: −50°F ≤ TJ ≤ 300°F for the LM34 and LM34A; −40°F ≤ TJ ≤ 230°F for the LM34C and LM34CA; and +32°F ≤ TJ ≤ 212°F for the LM34D. VS = 5 Vdc and ILOAD = 50 µA in the circuit of Full-Range Fahrenheit Temperature Sensor; 6 Vdc for LM34 and LM34A for 230°F ≤ TJ ≤ 300°F. These specifications also apply from 5°F to TMAX in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F).
PARAMETER CONDITIONS LM34 LM34C, LM34D UNIT
MIN TYP MAX MIN TYP MAX
Accuracy, LM34, LM34C(3) TA = 77°F Tested Limit(1) –2 2 –2 2 °F
Design Limit(2)
±0.8 ±0.8
TA = 0°F Tested Limit °F
Design Limit –3 3
±1 ±1
TA = TMAX Tested Limit –3 3 °F
Design Limit –3 3
±1.6 ±1.6
TA = TMIN Tested Limit °F
Design Limit –3 3 –4 4
±1.6 ±1.6
Accuracy, LM34D(3) TA = 77°F Tested Limit –3 3 °F
Design Limit
±1.2
TA = TMAX Tested Limit °F
Design Limit –4 4
±1.8
TA = TMIN Tested Limit °F
Design Limit –4 4
±1.8
Nonlinearity (4) Tested Limit °F
Design Limit –1.0 1 –1 1
±0.6 ±0.4
Sensor gain (Average Slope) Tested Limit 9.8 10.2 mV/°F
Design Limit 9.8 10.2
10 10
Load regulation(5) TA = 77°F
0 ≤ IL ≤ 1 mA		 Tested Limit –2.5 2.5 –2.5 2.5 mV/mA
Design Limit
±0.4 ±0.4
TMIN ≤ TA ≤ 150°F
0 ≤ IL ≤ 1 mA		 Tested Limit mV/mA
Design Limit –6.0 6 –6 6
±0.5 ±0.5
Line regulation(5) TA = 77°F,
5 V ≤ VS ≤ 30 V		 Tested Limit –0.1 0.1 –0.1 0.1 mV/V
Design Limit
±0.01 ±0.01
5 V ≤ VS ≤ 30 V Tested Limit mV/V
Design Limit –0.2 0.2 –0.2 0.2
±0.02 ±0.02
Quiescent current(6) VS = 5 V, TA = 77°F Tested Limit 100 100 µA
Design Limit
75 75
VS = 5 V Tested Limit µA
Design Limit 176 154
131 116
VS = 30 V, TA = 77°F Tested Limit 103 103 µA
Design Limit
76 76
VS = 30 V Tested Limit µA
Design Limit 181 159
132 117
Change of quiescent current(5) 4 V ≤ VS ≤ 30 V,
TA = +77°F		 Tested Limit 3 3 µA
Design Limit
0.5 0.5
5 V ≤ VS ≤ 30 V Tested Limit µA
Design Limit 5 5
1 1
Temperature coefficient of quiescent current Tested Limit µA/°F
Design Limit 0.7 0.7
0.3 0.3
Minimum temperature for rated accuracy In circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F), IL = 0 Tested Limit °F
Design Limit 5.0 5
3 3
Long-term stability TJ = TMAX for 1000 hours ±0.16 ±0.16 °F
(1) Tested limits are specified and 100% tested in production.
(2) Design limits are specified (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(3) Accuracy is defined as the error between the output voltage and 10 mV/˚F times the device’s case temperature at specified conditions of voltage, current, and temperature (expressed in ˚F).
(4) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the rated temperature range of the device.
(5) Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(6) Quiescent current is defined in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F).

6.7 Typical Characteristics

LM34 graph_01_snis161.gif
Figure 1. Thermal Resistance Junction to Air
LM34 graph_03_snis161.gif
Figure 3. Thermal Response in Still Air
LM34 graph_05_snis161.gif
Figure 5. Minimum Supply Voltage vs Temperature
LM34 graph_06_snis161.gif
Figure 7. Quiescent Current vs Temperature
(in Circuit of Full-Range Fahrenheit Temperature Sensor; −VS = −5V, R1 = 100k)
LM34 graph_09_snis161.gif
Figure 9. Accuracy vs Temperature (Specified)
LM34 graph_11_snis161.gif
Figure 11. Start-Up Response
LM34 graph_02_snis161.gif
Figure 2. Thermal Time Constant
LM34 graph_04_snis161.gif
Figure 4. Thermal Response in Stirred Oil Bath
LM34 graph_06_snis161.gif
Figure 6. Quiescent Current vs Temperature (in Circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F))
LM34 graph_08_snis161.gif
Figure 8. Accuracy vs Temperature (Specified)
LM34 graph_10_snis161.gif
Figure 10. Noise Voltage