SBOK051 November   2023 OPA4H014-SEP

PRODUCTION DATA  

  1.   1
  2.   OPA4H014-SEP Radiation Tolerant High-Speed, Quad-Channel Operational Amplifier TID Report
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased Device Configuration
    4. 2.4 Test Configuration and Condition
  6. 3Total Ionizing Dose Characterization Test Results
    1. 3.1 HDR Characterization Results
    2. 3.2 LDR Characterization Results
    3. 3.3 ELDRS Characterization Results
    4. 3.4 Summary of Results
  7.   A High Dose Rate Total Ionizing Dose Report
  8.   B Low Dose Rate Total Ionizing Dose Report

Abstract

This report covers the radiation characterization results of the OPA4H014-SEP, a high-speed quad-channel operational amplifier. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 30 krad(Si). The results show that all samples passed within the data sheet specified limits up to 30 krad(Si).

As a one-time characterization, additional exposure to 50 krad(Si) was performed for a subset of devices. For those devices exposed to 50 krad(Si), the measured input bias current specifications was found to be outside of the limit specified in the device data sheet, while all other parameters were found to be within the specified levels. For all production material, Radiation Lot Acceptance Testing (RLAT) will be performed using 22 units at a dose level of 30 krad(Si) for future wafer lots.

Additional one-time characterization of TID effects under Low Dose Rate (LDR) to 30 krad(Si) was performed. HDR and LDR data up 30-krad(Si) exposure levels were compared. As all parameters passed within the data sheet specified limits, the OPA4H014-SEP is considered non-Enhanced Low Dose Rate Sensitive (ELDRS) to 30 krad(Si) according to MIL-STD-883, Method 1019.