SFFS264 November   2021 OPA858-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Pin Failure Mode Analysis (Pin FMA)

1 Overview

This document contains information for OPA858-Q1 (WSON-8 package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Pin failure mode analysis (Pin FMA)

OPA858-Q1 shows the device functional block diagram for reference.

GUID-374A476E-5FB3-4949-8A80-119DCCE165EE-low.gifGUID-9E17A928-8EFB-49C8-AED6-30A386ED3004-low.gifFigure 1-1 Functional Block Diagram

OPA858-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.