SFFS765 July 2025 UCC27624-Q1
The failure mode distribution estimation for the UCC27624-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| OUTA stuck low | 8 |
| OUTB stuck low | 8 |
| OUTA stuck high | 8 |
| OUTB stuck high | 8 |
| OUTA unknown | 8 |
| OUTB unknown | 8 |
| UVLO stuck low | 2 |
| UVLO stuck high | 2 |
| UVLO unknown | 2 |
| ENA stuck high | 1 |
| ENA stuck low | 1 |
| ENA unknown | 1 |
| Others, no impact | 43 |