SLVAFI9 may   2023 TPS50601A-SP , TPS73801-SEP , TPS7H1101A-SP , TPS7H3301-SP , TPS7H3302-SEP , TPS7H4001-SP , TPS7H4002-SP , TPS7H4003-SEP , TPS7H4010-SEP , TPS7H5001-SP

PRODUCTION DATA  

  1.   Abstract
  2.   Trademarks
  3. 1Introduction
  4. 2Space Qualification Flow Overview
  5. 3Space Rated Power Devices
  6. 4Example Power Maps
    1. 4.1 Rad-Hard Power for RTG4
    2. 4.2 Rad-Tolerant Power for RTG4
  7. 5Conclusion

Space Qualification Flow Overview

TI has had a long history supporting the space industry by providing hermetically sealed QMLV (Qualified Manufacturer List, Class V) and RHA (Radiation Hardness Assured) components all in accordance with the MIL-PRF-38535 specification. In addition to the qualification standard, these devices are typically supported with extensive Total Ionizing Dose (TID) and Single Event Effects (SEE) radiation reports that are readily available in the product folder for each device. TI continues to support the highest-reliability space applications with ongoing and new development in hermetically sealed QMLV devices.

However, with the reduction in launch costs and stricter budgets, this has resulted in a different approach to satellite manufacturing for new commercial and government applications. To provide a design, TI has provided more cost-effective and smaller designs through a growing portfolio of devices in rad-tolerant Space Enhanced Plastic (denoted by -SEP) to meet the reduced assurance requirements for LEO and MEO constellations. Table 2-1 provides an overview between the differences of Space Enhanced Plastic and QMLV-RHA. For more information on TI's rad-tolerant flow, read how to Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products.

Table 2-1 Space Enhanced Plastic and QMLV-RHA
Rad-tolerant (-SEP) Rad-hard (-SP)
Packaging Plastic Ceramic-Hermetic
Single Controlled Baseline Yes Yes
Meets DLA spec for less than 2% Sn Au Al
Production Burn-in No Yes
Typical Temperature Range -55°C - 125°C -55°C - 125°C
Radiation: TID Characterization 30 to 50 krad(Si) 100 krad(Si)
Radiation Lot Acceptance Testing (RLAT) 20, 30 or 50 krad(Si) 100 krad(Si)
Radiation: SEE Characterization 43MeV-cm2/mg ≥75MeV-cm2/mg
Outgassing tested per ASTM E595 Yes N/A
Lot Level Temp Cycle Yes Yes
Per tube, tray or reel single lot date code Yes Yes
Life Test Per Wafer Lot No Yes