SNAK022 May   2024 LMX1860-SEP

 

  1.   1
  2.   LMX1860-SEP Single-Event Effects Test Report
  3.   Trademarks
  4. 1Product Description
  5. 2Test Setup
    1. 2.1 SEL Test
    2. 2.2 SEFI Test
    3. 2.3 Test Facility
  6. 3Results
    1. 3.1 SEL Results
    2. 3.2 SEFI Results
  7. 4Summary
  8. 5References

4 Summary

Under heavy ion testing of the LM1860-SEP, no SEFIs or SELs were detected at an LETeff greater than 43MeV-cm2 / mg, which was the maximum LET tested. SEL testing was performed at maximum operating voltage (2.6V) and with the junction at the maximum operating temperature (125°C).

The outputs could be upset, with events lasting as long as one microsecond before the output returned to the programmed frequency and power. The outputs did not always return in phase.