The test points on the board can be used for connecting to the input of a power supply and output load for the EVM. See Figure 3-1 for typical test setup. The functions of the test points connections are:

• VIN_EMI — Input supply to EVM including an EMI filter. Connect to an input supply. Connect at this point for EMI test.
• GND_EMI — Ground connection for the input supply
• VIN — Input supply to the IC. Can be connected to DMM to measure input voltage after EMI filter.
• VOUT — Output voltage test point of EVM. Can be connected to a desired load.
• GND — Ground test points
• EN — This test point is connected to the EN pin. By default, there is a pullup resistor, R1 (RENT), to VIN to enable the IC. This pin can also be used to enable and disable the device. See Section 2.1.2 for more information.
• PGOOD — This test point is connected to the PGOOD pin from the IC. This pin can also be tied to an external supply through a pullup resistor or left open. See Section 2.1.2 for more information.
• SYNC — In a MODE/SYNC trim part, this test point is connected to the SYNC pin of the IC. This test point can also be connected to an external clock to synchronize the IC. Make sure R9 (RJM) is installed and R8 (RSYNC) is not installed when applying a sync clock input. This pin can also be used to sync the converter to an external clock. See Section 2.1.2 for more information.

Figure 2-1 EVM Board Connections