SBAK020 April   2025 ADC3683-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the ADC3683-SEP dual 18-bit 65-MSPS ADC
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Irradiation Facility and Setup
  7. 4 Depth, Range, and LETEFF Calculations
  8. 5 Test Setup and Procedures
  9. 6 Destructive Single-Event Effects (DSEE)
  10. 7 Single-Event Transients (SET)
  11. 8 Event Rate Calculations
  12. 9 Summary
  13. 10References

6 Destructive Single-Event Effects (DSEE)

Single-Event Latch-Up (SEL) Results

During SEL characterization, the device was heated using forced hot air, maintaining the DUT temperature at 125°C. The die temperature was monitored prior to radiation using a FLIR IR-camera.

The species used for the SEL testing was Silver (109Ag) ion with an angle-of-incidence of 0° for an LETEFF = 51.12MeV × cm2/ mgm. Flux of 105 ions / cm2× s and a fluence of 107 ions / cm2 were used. The device was powered up and exposed to the heavy-ions using voltages up to 1.9V, with 1.85V being the maximum recommended operating voltage. No SEL events were observed during all three runs, indicating that the ADC3683-SEP is SEL-free. Table 7-2 lists the SEL test conditions and results. Figure 6-1 shows a typical plot of current versus time for SEL testing.

Table 6-1 Summary of ADC3683-SEP SEL Test Condition and Results
Run NumberTemperatureLETEFF (MeV × cm2/mg)Flux (ions × cm2/s)Fluence (ions × cm2)AVDD/IOVDD (V)
1Room, approximately 25°C51.121.85 × 1041 × 1071.9
2125°C51.121.8 × 1041 × 1071.9
3125°C51.121 × 1051 × 1071.9
4125°C51.121 × 1051 × 1071.9
ADC3683-SEP Current vs Time for ADC3683-SEP at T = 125°CFigure 6-1 Current vs Time for ADC3683-SEP at T = 125°C