SETs are defined as heavy-ion-induced transients upsets on the DCLK of the ADC3664-SEP. SET testing was performed at room temperature with no external temperature control applied. DCLK SEUs were characterized using a positive edge trigger. The devices were characterized with input voltages AVDD/IOVDD = 1.85V. To capture the event, the NI-PXI-5172 Scope Card was continuously monitoring the DCLK. The DCLK was monitored by using USER_LED3 that is located on the TSW1400EVM. The scope was attached to the LED which goes high upon because the FPGA was not receiving a valid clock signal. The scope triggering from DCLK was programmed to record 20K samples with a sample rate of 5M samples per second (S/s) in case of an event (trigger).

The scope was programmed to record 20% of the data before (pre-) the trigger happened. Events were seen on DCLK. An example of what we considered an "single" event is shown in Figure 7-1 and Figure 7-2.Table 7-1 lists the SET test condition and results for all the data.

Figure 7-1 Example #1 of a Single Event Seen During SET Run

Figure 7-2 Example #2 of a Single Event Seen During SET Run

Figure 7-3 FFT Capture of Nominal Operating Conditions