4 Summary

This application node proposes testing and designs for noise-induced SPI communication errors in smart devices. When SPI communication errors occur in applications with multiple communications, the first thing to check is whether the clock is properly input. Noise coupled to the clock signal can cause the AFE4xxx chip itself to malfunction. There are two ways to remove noise signals introduced into the clock: using a low-pass filter (LPF) to increase the buffer margin of the product hysteresis. However, when space and time constraints are limited, placing the LPF as close to the AFE4xxx (slave) as possible can resolve noise-induced issues.