SFFS034A July   2021  – July 2021 TPS1H000-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
  6. 5Revision History

Failure Mode Distribution (FMD)

The failure mode distribution estimation for TPS1H000-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
VOUT stuck open (HiZ)20%
VOUT stuck on (VS) 10%
VOUT functional, not in specification voltage or timing45%
Diagnostics not in specification10%
Protection function fails to trip10%
Pin to Pin short any two pins5%