SFFS063 June   2021 TCAN1046-Q1 , TCAN1046V-Q1

 

  1.   1
  2.   2
  3.   3
  4.   4
  5.   5

1 Overview

This document contains information for TCAN1046-Q1 and TCAN1046V-Q1 (VSON package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the TCAN1046-Q1 functional block diagram for reference. Figure 1-2 shows the TCAN1046V-Q1 functional block diagram for reference.

GUID-20210223-CA0I-WFXP-LWVQ-SHQ2GNQCVK3C-low.jpg Figure 1-1 TCAN1046-Q1 Functional Block Diagram
GUID-20210223-CA0I-MXGF-XN8Z-VB09N7P9VR8M-low.jpg Figure 1-2 TCAN1046V-Q1 Functional Block Diagram

TCAN1046-Q1 and TCAN1046V-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.