SFFS094 April   2021 ISO6720 , ISO6720-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 8-D (narrow body SOIC) Package
    2. 2.2 8-SOIC (wide-body SOIC) Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 8-D (narrow-body SOIC) and 8-DWV (wide-body SOIC) Package
  6. 5Revision History

4.1 8-D (narrow-body SOIC) and 8-DWV (wide-body SOIC) Package

Figure 4-1 shows the ISO6720/ISO6720-Q1 and ISO6720F/ISO6720F-Q1 pin diagram for the 8-D and 8-DWV packages. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the ISO6720/ISO6720-Q1 data sheet.

GUID-20201214-CA0I-BSJJ-WL0R-40VZZZ8BCRQ2-low.gifFigure 4-1 Pin Diagram (8-D and 8-DWV) Package
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
VCC11No power to the device on side-1. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be plausible.A
INA2Input signal shorted to ground, so output (OUTA) stuck to low. Communication from INA to OUTA corrupted.B
INB3Input signal shorted to ground, so output (OUTB) stuck to low. Communication from INB to OUTB corrupted.B
GND14Device continues to function as expected. Normal operation.D
GND25Device continues to function as expected. Normal operation.D
OUTB6OUTB stuck low. Data communication from INB to OUTB lost. Device damage possible if INB is driven high for extended period of time.A
OUTA7OUTA stuck low. Data communication from INA to OUTA lost. Device damage possible if INA is driven high for extended period of time.A
VCC28No power to the device on side-2. OUTA/OUTB pins state undetermined.B
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
VCC11Operation undetermined. Either device is unpowered and OUTA/OUTB=default logic state or through internal ESD diode on any IN pin, device can power up if any IN is driven to logic high. If IN pin has current sourcing capability to provide regular operating current of device, ESD diode conducts that current and device damage possible.

A

INA2No communication to INA channel possible. OUTA stuck to default state (High for ISO6720/ISO6720-Q1 and Low for ISO6720F/ISO6720F-Q1).B
INB3No communication to INB channel possible. OUTB stuck to default state (High for ISO6720/ISO6720-Q1 and Low for ISO6720F/ISO6720F-Q1).B
GND14Device unpowered on side1. OUTA/OUTB go to default state (High for ISO6720/ISO6720-Q1 and Low for ISO6720F/ISO6720F-Q1).B
GND25Device unpowered on side-2. OUTA/OUTB state undetermined.B
OUTB6State of OUTB undetermined. Data communication from INB to OUTB lost.B
OUTA7State of OUTA undetermined. Data communication from INA to OUTA lost.B
VCC28Device unpowered on side-2 and state of OUTA/OUTB undetermined.B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin NamePin No.Shorted toDescription of Potential Failure Effect(s)Failure Effect Class
VCC11INAINA stuck high. External bit-stream for communication to INA pin corrupted. OUTA stuck high.B
INA2INBCommunication corrupted for either INA or INB channel.B
INB3GND1Input signal shorted to ground, so output (OUTB) stuck to low. Communication from INB to OUTB corrupted.B
GND14INBAlready considered in above row.B
GND25OUTBOUTB pin stuck low. Communication corrupted. If IN pin is driven high for extended duration, OUTB pin stuck low creates a short between supply and ground with possible device damage.A
OUTB6OUTACommunication corrupted for either OUTA or OUTB channel. Device damage possible if INA and INB try to drive opposite logic state for extended duration creating a short between supply and ground on side-2.A
OUTA7VCC2OUTA stuck high. Data communication from INA to OUTA lost. Device damage possible if INA is driven low for extended period of time.A
VCC28OUTAAlready considered in above row.A
Table 4-5 Pin FMA for Device Pins Short-Circuited to supply
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
VCC11No effect. Normal operation.D
INA2INA pin stuck high. Communication corrupted. OUTA stuck high.B
INB3INB pin stuck high. Communication corrupted. OUTB stuck high.B
GND14Device side-1 unpowered. Observe that the absolute maximum ratings for INA/INB pins of the device are met, otherwise device damage may be plausible.A
GND25Device side-2 unpowered. OUTA/OUTB state undetermined.B
OUTB6OUTB stuck high. Communication disrupted. If INB is low for extended duration, OUTB being stuck high creates a short and can damage the device.A
OUTA7OUTA stuck high. Communication disrupted. If INA is low for extended duration, OUTA being stuck high creates a short and can damage the device.A
VCC28No effect. Normal operation.D