SFFS302 October   2021 SN74LVC1G3157-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 DBV Package
    2. 2.2 DCK Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 SN74LVC1G3157-Q1 DBV and DCK Package

1 Overview

This document contains information for SN74LVC1G3157-Q1 (DBV and DCK package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-B73B04F0-C059-4324-92A5-88A5EF97301A-low.gif Figure 1-1 Functional Block Diagram

SN74LVC1G3157-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.