SFFS318A October   2021  – April 2022 TLC2272A-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 SOIC (D) 8 Package
    2. 2.2 TSSOP (PW) 8 Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 SOIC (D) 8 Package
    2. 4.2 TSSOP (PW) 8 Package
  6. 5Revision History

4.1 SOIC (D) 8 Package

Figure 4-1 shows the TLC2272A-Q1 pin diagram for the SOIC (D) 8 package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TLC2272A-Q1 data sheet.

GUID-E236EC6E-FCEE-4BCB-9497-C2500CAC3A0E-low.gif Figure 4-1 Pin Diagram (SOIC (D) 8) Package
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
1OUT 1 Depending on circuit configuration, the device will likely be forced into a short-circuit condition with the 1OUT voltage ultimately forced to the VDD‒ voltage. Prolonged exposure to short-circuit conditions could result in long-term reliability issues. A
1IN– 2 Negative feedback not present to the device. Depending on the circuit configuration, the output will most likely move to the negative supply. B
1IN+ 3 Device common-mode; tied to negative rail. Depending on the circuit configuration, the output will likely not respond because of the device being put into an invalid common-mode condition. C
2IN+ 5 Device common-mode; tied to negative rail. Depending on the circuit configuration, the output will likely not respond because of the device being put in an invalid common-mode condition. C
2IN– 6 Negative feedback not present to the device. Depending on the circuit configuration, the output will most likely move to the negative supply. B
2OUT 7 Depending on the circuit configuration, the device will likely be forced into a short-circuit condition, with the 2OUT voltage ultimately forced to the VDD‒ voltage. Prolonged exposure to short-circuit conditions could result in long-term reliability issues. A
VDD+ 8 Op-amp supplies will be shorted together, leaving the VDD+ pin at some voltage between the VDD+ and VDD‒ sources (depending on source impedance). A
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
1OUT 1 No negative feedback or ability for 1OUT to drive the application. B
1IN– 2 Inverting pin of the op amp; left floating. Negative feedback will not be provided to the device, likely resulting in the device output moving between the positive and negative rails. The 1IN‒ pin voltage will likely end up at the positive or negative rail because of leakage on the ESD diodes. B
1IN+ 3 Input common-mode; left floating. The op amp will not be provided with common-mode bias, and the device output will likely end up at the positive or negative rail. The 1IN+ pin voltage will likely end up at the positive or negative rail because of leakage on the ESD diodes. B
VDD– 4 Negative supply; left floating. The op amp ceases to function because no current can source or sink to the device. B
2IN+ 5 Input common-mode; left floating. The op amp will not be provided with common-mode bias, and the device output will likely end up at the positive or negative rail. The 2IN+ pin voltage will likely end up at the positive or negative rail because of leakage on the ESD diodes. B
2IN– 6 Inverting pin of the op amp; left floating. Negative feedback will not be provided to the device, likely resulting in the device output moving between the positive and negative rails. The 2IN‒ pin voltage will likely end up at the positive or negative rail because of leakage on the ESD diodes. B
2OUT 7 No negative feedback or ability for 2OUT to drive the application. B
VDD+ 8 Positive supply; left floating. The op amp ceases to function because no current can source or sink to the device. A
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin Name Pin No. Shorted to Description of Potential Failure Effect(s) Failure Effect Class
1OUT 1 2 Depending on the circuit configuration, the circuit gain will be reduced to unity gain, and the application may not function as intended. B
1IN– 2 3 Both inputs will be tied together. Depending on the offset of the device, this will likely move the output voltage to near mid-supply. D
1IN+ 3 4 Device common-mode; tied to negative rail. Depending on the circuit configuration, the output will likely not respond because of the device being put into an invalid common-mode condition. C
VDD– 4 5 Device common-mode; tied to negative rail. Depending on the circuit configuration, the output will likely not respond because of the device being put into an invalid common-mode condition. C
2IN+ 5 6 Both inputs will be tied together. Depending on the offset of the device, this configuration will likely move the output voltage to near mid-supply. D
2IN– 6 7 Depending on the circuit configuration, the circuit gain will be reduced to unity gain and the application may not function as intended. B
2OUT 7 8 Depending on the circuit configuration, the device will likely be forced into a short-circuit condition, with the 2OUT voltage ultimately forced to the VDD+ voltage. Prolonged exposure to short-circuit conditions could result in long-term reliability issues. A
VDD+ 8 1 Depending on the circuit configuration, the device will likely be forced into a short-circuit condition, with the VDD+ voltage ultimately forced to the 1OUT voltage. Prolonged exposure to short-circuit conditions could result in long-term reliability issues. A
Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
1OUT 1 Depending on the circuit configuration, the device will likely be forced into a short-circuit condition, with the 1OUT voltage ultimately forced to the VDD+ voltage. Prolonged exposure to short-circuit conditions could result in long-term reliability issues. A
1IN– 2 Negative feedback not present to the device. Depending on the noninverting input voltage and circuit configuration, the output will most likely move to the negative supply. B
1IN+ 3 Depending on the circuit configuration, the application will likely not function because of the device common-mode being connected to 1IN+. B
VDD– 4 Op-amp supplies will be shorted together, leaving the VDD‒ pin at some voltage between the VDD‒ and VDD+ sources (depending on source impedance). A
2IN+ 5 Depending on the circuit configuration, the application will likely not function because of the device common-mode being connected to 2IN+. B
2IN– 6 Negative feedback not present to the device. Depending on the noninverting input voltage and circuit configuration, the output will most likely move to the negative supply. B
2OUT 7 Depending on the circuit configuration, the device will likely be forced into a short-circuit condition, with the 2OUT voltage ultimately forced to the VDD+ voltage. Prolonged exposure to short-circuit conditions could result in long-term reliability issues. A