SFFS633 August   2025 TPS22995H-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
  7. 5Revision History

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for TPS22995H-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
VOUT open or Hi-Z25
VOUT stuck on (VIN)15
VOUT outside specification (voltage or rise time)45
QOD stuck on 5
QOD stuck off5
Pin to pin short (any two pins)5