SFFS719 November   2023 LMR66430 , LMR66430-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)

1 Overview

This document contains information for LMR664x0 and LMR664x0-Q1 (VQFN package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 and Figure 1-2 show the functional block diagram of LMR664x0 and LMR664x0-Q1 for reference.

GUID-20231023-SS0I-3BS9-PHVS-P0S9CNJ4SPPF-low.svg Figure 1-1 LMR664x0 Functional Block Diagram
GUID-20231023-SS0I-65R9-HRGW-SR917LF2CWQR-low.svg Figure 1-2 LMR664x0-Q1 Functional Block Diagram

LMR664x0 and LMR664x0-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.