SFFS950 October 2024 LM74930-Q1
The failure mode distribution estimation for LM74930-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| DGATE output functional, not in specification voltage or timing | 14 |
| DGATE stuck at high | 11 |
| DGATE stuck at low | 15 |
| HGATE output functional, not in specification voltage or timing | 9 |
| HGATE stuck at high | 5 |
| HGATE stuck at low | 17 |
| IMON not in specification - current or timing | 5 |
| Overcurrent protection fails to trip or false trip | 6 |
| Short circuit protection fails to trip or false trip | 5 |
| UVLO, OV fails to trip or false trip | 8 |
| Pin-to-pin short | 5 |