SFFSA44 December   2024 OPA991-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 SOT-23 (DBV) - 5 Package
    2. 2.2 SOT-23 (DBV) - 6 Package
    3. 2.3 SOT-SC70 (DCK) - 5 Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 SOT-23 (DBV) - 5 Package
    2. 4.2 SOT-SC70 (DCK) - 5 Package
    3. 4.3 SOT-23 (DBV) - 6 Package
  7. 5Revision History

Pin Failure Mode Analysis (Pin FMA)

This section provides a failure mode analysis (FMA) for the pins of the OPA991-Q1 (SOT-23 (DBV) - 5, SOT-SC70 (DCK) - 5, and SOT-23 (DBV) - 6 packages). The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Table 4-2 through Table 4-13 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
ClassFailure Effects
APotential device damage that affects functionality.
BNo device damage, but loss of functionality.
CNo device damage, but performance degradation.
DNo device damage, no impact to functionality or performance.

Following are the assumptions of use and the device configuration for the pin FMA in this section:

  • Short circuit to power means short to V+
  • Short circuit to GND and short circuit to ground mean short to V‒
  • V+ is equivalent to VCC
  • V‒ is equivalent to VEE