SFFSAC9A November 2025 – December 2025 CSD967201-Q1
This section provides a failure mode analysis (FMA) for the pins of the CSD967201. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality. |
| B | No device damage, but loss of functionality. |
| C | No device damage, but performance degradation. |
| D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the CSD967201 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the CSD967201 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
| Pin No. | Pin Name | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| 1 | BP33 | The device does not allow PWM switching and remains in tri-state mode. | B |
| 2 | AGND | The device continues to operate, but the AGND pin potentially experiences more disturbance to the transient ground. The PWM and interface parametrical are potentially skewed. | C |
| 3 | VCC | The device remains in a POR state. The device does not power on and remains in reset. | B |
| 4 | VDRV | The device remains in a POR state. The device does not power on and remains in reset. | B |
| 5-10 | PGND | The device operates as normal with full functionality. | D |
| 19-22 | |||
| 35 | |||
| 37 | |||
| 11-18 | SW | The device is not functional and the power stage is not able to control VOUT. The peak current limit is used to limit the current of the high-side FET. The SW pin to ground causes the system regulation to drop to 0V. If there is a hard 0Ω short, there is potential damage to the internal high-side FET. | A |
| 23 | |||
| 38 | |||
| 24-29 | VIN | The device does not allow the power stage or IMON to function, and the device remains in a non-switching mode. | B |
| 30 | PHASE | The device is not functional and the power stage is not able to control VOUT. The peak current limit is used to limit the current of the high-side FET. The SW pin to ground causes the system regulation to drop to 0V. If there is a hard 0Ω short, there is potential damage to the internal high-side FET. | A |
| 31 | BOOT | The boot cap cannot charge, and the device does not have a floating supply for the boot domain. The boot UV detection does not allow the high-side FET to turn on, potentially causing a loss of regulation in the system. | B |
| 32 | PWM | There is a loss of functionality, with the low-side FET staying on after start-up. | B |
| 33 | EN | The device does not allow for PWM switching. | A |
| 34 | TMON/FLT | There is excessive current on the VDRV pin, with no TMON signal for all power stages in the system. | B |
| 36 | IMON | The controller sources large current from CSBIAS across the internal or external 1kΩ resistor in the system. Faults potentially do not trigger correctly. | A |
| Pin No. | Pin Name | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| 1 | BP33 | If no cap is connected, the LDO is unstable. The PWM is potentially falsely detected, and TMON potentially experiences small oscillations. | C |
| 2 | AGND | The device does not interpret the PWM signal correctly and potentially does not turn on. | C |
| 3 | VCC | The device remains in a POR state. The device does not power on and remains in reset. | B |
| 4 | VDRV | The device remains in a POR state. The device does not power on and remains in reset. | B |
| 5-10 | PGND | GND is still present due to multiple PGND pins. The full functionality of the device is maintained. | D |
| 19-22 | |||
| 35 | |||
| 37 | |||
| 11-18 | SW | The device is not functional and output regulation cannot be controlled by the power stage. | B |
| 23 | |||
| 38 | |||
| 24-29 | VIN | The device does not allow the power stage or IMON to function, and the device remains in a non-switching mode. | B |
| 30 | PHASE | The device is not functional, and output regulation cannot be controlled by the power stage. | B |
| 31 | BOOT | The boot cap cannot charge, and the device does not have a floating supply for the boot domain. The boot UV detection does not allow the high-side FET to turn on, potentially causing a loss of regulation in the system. | B |
| 32 | PWM | The device detects this pin as a PWM tri-state input and both the low-side and high-side FETs remain off. | B |
| 33 | EN | The device pulls down internally and does not allow the PWM input to turn the power stage on or off. | B |
| 34 | TMON/FLT | The TMON output does not report for the power stage. | B |
| 36 | IMON | The controller sources large current from CSBIAS across the internal or external 1kΩ resistor in the system. Faults potentially do not trigger correctly. | A |
| Pin No. | Pin Name | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| 1 | BP33 | IMON | Depending on the strength of the IMON drive, the BP33 pin is likely to dominate. The BP33 pin potentially rises to VCC. | B |
| AGND | The device does not allow PWM switching and remains in tri-state mode. | B | ||
| 2 | AGND | BP33 | The device does not allow PWM switching and remains in tri-state mode. | B |
| VCC | The device remains in a POR state. The device does not power on and remains in reset. | B | ||
| 3 | VCC | AGND | The device remains in a POR state. The device does not power on and remains in reset. | B |
| VDRV | The device functions. There is no filter between the VCC and VDRV pins. The system potentially has more jitter. | C | ||
| 4 | VDRV | VCC | The device functions. There is no filter between the VCC and VDRV pins. The system potentially has more jitter. | C |
| PGND | The device remains in a POR state. The device does not power on and remains in reset. | B | ||
| 5-10 | PGND | VDRV | The device remains in a POR state. The device does not power on and remains in reset. | B |
| 19-22 | IMON | The controller sources large current from CSBIAS across the internal or external 1kΩ resistor in the system. Faults potentially do not trigger correctly. | A | |
| 35 | TMON/FLT | There is excessive current on the VDRV pin, with no TMON signal for all power stages in the system. | B | |
| 37 | VIN | The device does not allow the power stage or IMON to function, and the device remains in a non-switching mode. | B | |
| SW | The device is not functional and the power stage is not able to control VOUT. The peak current limit is used to limit the current of the high-side FET. The SW pin to ground causes the system regulation to drop to 0V. If there is a hard 0Ω short, there is potential damage to the internal high-side FET. | A | ||
| 11-18 | SW | PGND | The device is not functional and the power stage is not able to control VOUT. The peak current limit is used to limit the current of the high-side FET. The SW pin to ground causes the system regulation to drop to 0V. If there is a hard 0Ω short, there is potential damage to the internal high-side FET. | A |
| 23 | ||||
| 38 | VIN | This is equivalent to a high-side FET short. The high-side short protection turns on the low-side FET and potentially damages the FET. | A | |
| 24-29 | VIN | SW | This is equivalent to a high-side FET short. The high-side short protection turns on the low-side FET and potentially damages the FET. | A |
| PHASE | This is equivalent to a high-side FET short. The high-side short protection turns on the low-side FET and potentially damages the FET. | A | ||
| 30 | PHASE | VIN | This is equivalent to a high-side FET short. The high-side short protection turns on the low-side FET and potentially damages the FET. | A |
| BOOT | The boot cap does not have a floating supply for the boot domain. The boot UV detection does not allow the high-side FET to turn on, potentially causing a loss of regulation in the system. | B | ||
| 31 | BOOT | PHASE | The boot cap does not have a floating supply for the boot domain. The boot UV detection does not allow the high-side FET to turn on, potentially causing a loss of regulation in the system. | B |
| PWM | The boot cap does not have a floating supply for the boot domain. The boot UV detection does not allow the high-side FET to turn on, potentially causing a loss of regulation in the system. If the BOOT pin is higher than the VCC supply, damage can occur to the PWM input. | B | ||
| 32 | PWM | BOOT | The boot cap does not have a floating supply for the boot domain. The boot UV detection does not allow the high-side FET to turn on, potentially causing a loss of regulation in the system. If the BOOT pin is higher than the VCC supply, damage can occur to the PWM input. | B |
| EN | If EN = VCC, the high-side FET remains on. | B | ||
| 33 | EN | PWM | If EN = VCC, the high-side FET remains on. | B |
| TMON/FLT | There is a loss of TMON and FAULT detection. TMON does not function. | B | ||
| 34 | TMON/FLT | EN | There is a loss of TMON and FAULT detection. TMON does not function. | B |
| VIN | There is damage to the internal, 5V-rated circuitry. If VIN > 8V, there is potential damage to the device. | A | ||
| 36 | IMON | VIN | There is damage to the internal, 5V-rated circuitry. If VIN > 8V, there is potential damage to the device. | A |
| BP33 | The controller sinks large current from the BP33 pin across the internal or external 1kΩ resistor in the system. Faults potentially do not trigger correctly. | A |
| Pin No. | Pin Name | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| 1 | BP33 | There is damage to the internal, 5V-rated circuitry. If VIN > 8V, there is potential damage to the device. | A |
| 2 | AGND | The power supply is missing. The device does not power up, with a large uncontrolled VIN input current, which potentially causes damage to the device. | A |
| 3 | VCC | There is damage to the internal, 5V-rated circuitry. If VIN > 8V, there is potential damage to the device. | A |
| 4 | VDRV | There is damage to the internal, 5V-rated circuitry. If VIN > 8V, there is potential damage to the device. | A |
| 5-10 | PGND | The power supply is missing. The device does not power up, with a large uncontrolled VIN input current, which potentially causes damage to the device. | A |
| 19-22 | |||
| 35 | |||
| 37 | |||
| 11-18 | SW | There is potential damage to the low-side FET. The high-side short detection forces the low-side FET to turn on if EN = 1. | A |
| 23 | |||
| 38 | |||
| 30 | PHASE | There is potential damage to the low-side FET. The high-side short detection forces the low-side FET to turn on if EN = 1. | A |
| 31 | BOOT | There is potential damage to the low-side FET. The high-side short detection forces the low-side FET to turn on if EN = 1. | A |
| 32 | PWM | There is damage to the internal, 5V-rated circuitry. If VIN > 8V, there is potential damage to the device. | A |
| 33 | EN | There is damage to the internal, 5V-rated circuitry. If VIN > 8V, there is potential damage to the device. | A |
| 34 | TMON/FLT | There is damage to the internal, 5V-rated circuitry. If VIN > 8V, there is potential damage to the device. | A |
| 36 | IMON | There is damage to the internal, 5V-rated circuitry. If VIN > 8V, there is potential damage to the device. Faults potentially do not trigger correctly. | A |