SFFSAC9C November 2025 – August 2026 CSD967201-Q1
The failure mode distribution estimation for the CSD967201-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Power FET damage | 48 |
| SW output not in specification – voltage or timing | 27 |
| SW power HS or LS FET stuck on | 17 |
| IMON output not in specification | 5 |
| EN fails or false enable | 3 |