SLAK033A December   2024  – June 2026 DAC121S101-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Overview
  5. 2 SEE Mechanisms
  6. 3 Test Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Single-Event Latch-Up Results
  9. 6 Summary
  10. 7 Single-Event Transient Results
  11. 8 Confidence Interval Calculations
  12. 9 References
  13. 10Revision History

Abstract

The purpose of this study is to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the DAC121S101-SEP, a single channel, 12-bit digital-to-analog converter (DAC). Heavy-ions with an LETEFF of 43 MeV-cm2/mg were used to irradiate two production devices with a fluence of 1× 107 ions/cm2 and one production device with a fluence of 1.5 × 107 ions/cm2. The results demonstrate that the DAC121S101-SEP is SEL-free up to LETEFF = 43 MeV-cm2/mg at 125°C.