SLCS011D May   1992  – July 2025 TLV2352 , TLV2352M

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Description
  4. 3Device Comparison Table
  5. 4Pin Configuration and Functions
  6. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Recommended Operating Conditions
    3. 5.3  Electrical Characteristics TLV2352I
    4. 5.4  Switching Characteristics TLV2352I 3V
    5. 5.5  Switching Characteristics TLV2352I 3V (TLV2352IDR and TLV2352IPWR only)
    6. 5.6  Switching Characteristics TLV2352I 5V
    7. 5.7  Switching Characteristics TLV2352I 5V (TLV2352IDR and TLV2352IPWR only)
    8. 5.8  Electrical Characteristics TLV2352M
    9. 5.9  Switching Characteristics TLV2352M 3V
    10. 5.10 Switching Characteristics TLV2352M 5V
  7. 6Typical Characteristics (TLV2352IDR and TLV2352IPWR only)
  8. 7Device and Documentation Support
    1. 7.1 Receiving Notification of Documentation Updates
    2. 7.2 Support Resources
    3. 7.3 Trademarks
    4. 7.4 Electrostatic Discharge Caution
    5. 7.5 Glossary
  9. 8Revision History
  10. 9Mechanical, Packaging, and Orderable Information

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD Supply voltage(2) 8 V
VID Differential input voltage(3) ±VDD V
VI Input voltage range –0.3 VDD V
VO Output voltage 8 V
II Input current ±5 mA
IO Output current 20 mA
Duration of output short-circuit current to GND(4) Unlimited
TA Operating free-air temperature range TLV2352I –40 85 ℃
TLV2352M –55 125
Tstg Storage temperature range –65 150 ℃
Lead temperature 1.6mm (1/16 inch) from case for 10 seconds D package 260 ℃
P package
PW package
Lead temperature 1.6mm (1/16 inch) from case for 10 seconds FK package 300 ℃
JG package
U package
(1) Stress beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential voltages, are with respect to network ground.
(3) Differential voltages are at IN+ with respect to IN–.
(4) Short circuits from outputs to VDD can cause excessive heating and eventual device destruction.