SLLSE26E november   2010  – august 2023 ISO35T

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Revision History
  6. Pin Configuration and Functions
    1.     Pin Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Power Ratings
    6. 6.6  Insulation Specifications
    7. 6.7  Safety-Related Certifications
    8. 6.8  Safety Limiting Values
    9. 6.9  Electrical Characteristics: Driver
    10. 6.10 Electrical Characteristics: Receiver
    11. 6.11 Supply Current
    12. 6.12 Transformer Driver Characteristics
    13. 6.13 Switching Characteristics: Driver
    14. 6.14 Switching Characteristics: Receiver
    15. 6.15 Insulation Characteristics Curves
    16. 6.16 Typical Characteristics
  8. Parameter Measurement Information
    1.     26
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Device Functional Modes
      1. 8.3.1 Device I/O Schematics
  10. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Transient Voltages
      3. 9.2.3 Application Curve
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Community Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  14. 13Mechanical, Packaging, and Orderable Information

GUID-C0ADBD1B-92A2-496C-8746-E41C79B1A6CC-low.gifFigure 7-1 Driver VOD Test and Current Definitions
GUID-B46FC34A-CD8A-4F3E-94BC-B539EF043C66-low.gifFigure 7-2 Driver VOD With Common-Mode Loading Test Circuit
GUID-672B8CC0-D9D1-41D3-B350-DFD41F32B293-low.gifFigure 7-3 Test Circuit and Waveform Definitions For The Driver Common-Mode Output Voltage
GUID-6F902037-720F-4D09-B81B-3CB7557E6C8C-low.gifFigure 7-4 Driver Short-Circuit Test Circuit and Waveforms (Short Circuit applied at Time t=0
GUID-C0BA3B64-1014-467A-9C87-AA8C30FA5B24-low.gifFigure 7-5 Driver Switching Test Circuit and Voltage Waveforms
GUID-507AE889-79FA-4FFD-9F05-F4161927CFD7-low.gifFigure 7-6 Driver High-Level Output Enable and Disable Time Test Circuit and Voltage Waveforms
GUID-33DCAE5E-833F-4BE1-B80E-4990183BD8C4-low.gifFigure 7-7 Driver Low-Level Output Enable and Disable Time Test Circuit and Voltage Waveform
GUID-314F0279-4957-46F4-83B0-DC1B252D51E3-low.gifFigure 7-8 Receiver Voltage and Current Definitions
GUID-24073140-BDDD-4F0B-A95F-C3037EB35ECE-low.gifFigure 7-9 Receiver Switching Test Circuit and Waveforms
GUID-FF48F3BD-CD4A-47B5-9C56-28C37E9C71D4-low.gifFigure 7-10 Receiver Enable Test Circuit and Waveforms, Data Output High
GUID-46F23CD9-9554-446C-AE4B-8879D4E6B6B7-low.gifFigure 7-11 Receiver Enable Test Circuit and Waveforms, Data Output Low
GUID-B456CD86-BC21-4B5C-9D0F-46D571823EC6-low.gifFigure 7-12 Transient Over-Voltage Test Circuit
GUID-BBFE572A-3C04-4BE6-97FD-7F972446CEA8-low.gifFigure 7-13 Common-Mode Transient Immunity Test Circuit
GUID-4ACA5578-1BFE-465A-9B8C-48C9621DD8AE-low.gifFigure 7-14 Transition Times and Break-Before-Make Time Delay for D1, D2 Outputs