Data at high and low temperatures are applicable only within the rated operating free-air temperature range of the particular devices.

For New Die, at T_A = 25°C, V_S = 36V (±18V), V_CM = V_S / 2, and R_LOAD = 10kΩ connected to V_S / 2 (unless otherwise noted)

Figure 5-1 Quiescent Current vs Supply Voltage (New Die)

Figure 5-3 Open-Loop Output Impedance vs Frequency (New Die)

G = –1, 100mV output step, RL = open

Figure 5-5 Small-Signal Overshoot vs Capacitive Load (New Die)

VS = 5V to 36V

Figure 5-7 Power Supply Rejection Ratio vs Temperature (New Die)

VS = 15V

Figure 5-9 Maximum Output Voltage vs Frequency (New Die)

Figure 5-11 Open-Loop Gain and Phase vs Frequency (New Die)

Figure 5-13 Common-mode Rejection Ratio vs Frequency (Old Die)

Figure 5-15 Voltage-follower Large-signal Pulse Response (Old die)

G = –1, RL = open

Figure 5-17 Large-Signal Step Response, G = –1 (New Die)

Figure 5-2 Quiescent Current vs Temperature (New Die)

G = 1, 100mV output step, RL = open

Figure 5-4 Small-Signal Overshoot vs Capacitive Load (New Die)

Figure 5-6 PSRR vs Frequency (New Die)

Figure 5-8 Maximum Peak-to-peak Output Voltage vs Frequency (Old Die)

Figure 5-10 Open-loop Large-signal Differential Voltage Amplification vs Frequency (Old Die)

Figure 5-12 Closed-Loop Gain vs Frequency (New Die)

Figure 5-14 CMRR vs Frequency (New Die)

G = 1, RL = open

Figure 5-16 Large-Signal Step Response, G = 1 (New Die)