SLUAAD4 February   2021 BQ76952 , BQ76972

 

  1.   Trademarks
  2. 1Introduction
  3. 2Setup
  4. 3Measurement Data
    1. 3.1 Graphical Data
  5. 4Summary
  6. 5References

3 Measurement Data

During the testing, no incidents of component breakdown or latchup were observed on any of the devices. The following plots show the pre-stress and post-stress results for each cell voltage measurement using a 1-V and 4-V input, as well as selected Short Circuit in Discharge (SCD), Overcurrent in Discharge 1 (OCD1), and Overcurrent in Charge (OCC) thresholds. The plots titled "Delta in …" show the difference in the post-stress and pre-stress measurements on each specific device.