SLVK145 august   2023 TPS7H2201-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H2201-SEP eFuse
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects
  6. Device and Test Board Information
  7. Irradiation Facility and Setup
  8. Depth, Range, and LETEFF Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. Event Rate Calculations
  13. 10Summary
  14.   A References

Trademarks

National Instruments™ and LabVIEW™ are trademarks of National Instruments.

HP-Z4™ is a trademark of Hewlett-Packard.

All trademarks are the property of their respective owners.