SLVK178 September   2024 TPS7H1121-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Conditions
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 TPS7H1121-SP Data Sheet Electrical Parameters
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: HDR TID Report Data

2.2 Test Description and Facilities

The TPS7H1121-SP HDR exposure was performed on biased and unbiased devices in a Co-60 gamma cell at the Dallas CLAB (DCLAB) at Texas Instruments in Dallas, Texas. The unattenuated dose rate of this cell is 174.936 rads (Si)/s. After exposure, the devices were brought to Junkins Laboratory at Texas Instruments in Dallas for full post-radiation electrical evaluation using Texas Instruments ATE. ATE test limits are set per data sheet electrical limits based on preliminary qualification and characterization data.